On the origin of resonance features in reflectance difference data of silicon
K. Hingerl, R.. Balderas-Navarro, A. Bonanni, P. Tichopadek, W. Schmidt, Applied Surface Science 175–176 (2002) 769–776.
Download
No fulltext has been uploaded.
Journal Article
| Published
| English
Author
Hingerl, K;
Balderas-Navarro, R.E;
Bonanni, A;
Tichopadek, P;
Schmidt, Wolf
Publishing Year
Journal Title
Applied Surface Science
Volume
175-176
Page
769-776
ISSN
LibreCat-ID
Cite this
Hingerl K, Balderas-Navarro R., Bonanni A, Tichopadek P, Schmidt W. On the origin of resonance features in reflectance difference data of silicon. Applied Surface Science. 2002;175-176:769-776. doi:10.1016/s0169-4332(01)00114-3
Hingerl, K., Balderas-Navarro, R. ., Bonanni, A., Tichopadek, P., & Schmidt, W. (2002). On the origin of resonance features in reflectance difference data of silicon. Applied Surface Science, 175–176, 769–776. https://doi.org/10.1016/s0169-4332(01)00114-3
@article{Hingerl_Balderas-Navarro_Bonanni_Tichopadek_Schmidt_2002, title={On the origin of resonance features in reflectance difference data of silicon}, volume={175–176}, DOI={10.1016/s0169-4332(01)00114-3}, journal={Applied Surface Science}, author={Hingerl, K and Balderas-Navarro, R.E and Bonanni, A and Tichopadek, P and Schmidt, Wolf}, year={2002}, pages={769–776} }
Hingerl, K, R.E Balderas-Navarro, A Bonanni, P Tichopadek, and Wolf Schmidt. “On the Origin of Resonance Features in Reflectance Difference Data of Silicon.” Applied Surface Science 175–176 (2002): 769–76. https://doi.org/10.1016/s0169-4332(01)00114-3.
K. Hingerl, R. . Balderas-Navarro, A. Bonanni, P. Tichopadek, and W. Schmidt, “On the origin of resonance features in reflectance difference data of silicon,” Applied Surface Science, vol. 175–176, pp. 769–776, 2002.
Hingerl, K., et al. “On the Origin of Resonance Features in Reflectance Difference Data of Silicon.” Applied Surface Science, vol. 175–176, 2002, pp. 769–76, doi:10.1016/s0169-4332(01)00114-3.
Google Scholar