On the origin of resonance features in reflectance difference data of silicon
K. Hingerl, R.E. Balderas-Navarro, A. Bonanni, P. Tichopadek, W.G. Schmidt, Applied Surface Science 175–176 (2002) 769–776.
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Journal Article
| Published
| English
Author
Hingerl, K;
Balderas-Navarro, R.E;
Bonanni, A;
Tichopadek, P;
Schmidt, Wolf GeroLibreCat 
Department
Publishing Year
Journal Title
Applied Surface Science
Volume
175-176
Page
769-776
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Hingerl K, Balderas-Navarro RE, Bonanni A, Tichopadek P, Schmidt WG. On the origin of resonance features in reflectance difference data of silicon. Applied Surface Science. 2002;175-176:769-776. doi:10.1016/s0169-4332(01)00114-3
Hingerl, K., Balderas-Navarro, R. E., Bonanni, A., Tichopadek, P., & Schmidt, W. G. (2002). On the origin of resonance features in reflectance difference data of silicon. Applied Surface Science, 175–176, 769–776. https://doi.org/10.1016/s0169-4332(01)00114-3
@article{Hingerl_Balderas-Navarro_Bonanni_Tichopadek_Schmidt_2002, title={On the origin of resonance features in reflectance difference data of silicon}, volume={175–176}, DOI={10.1016/s0169-4332(01)00114-3}, journal={Applied Surface Science}, author={Hingerl, K and Balderas-Navarro, R.E and Bonanni, A and Tichopadek, P and Schmidt, Wolf Gero}, year={2002}, pages={769–776} }
Hingerl, K, R.E Balderas-Navarro, A Bonanni, P Tichopadek, and Wolf Gero Schmidt. “On the Origin of Resonance Features in Reflectance Difference Data of Silicon.” Applied Surface Science 175–176 (2002): 769–76. https://doi.org/10.1016/s0169-4332(01)00114-3.
K. Hingerl, R. E. Balderas-Navarro, A. Bonanni, P. Tichopadek, and W. G. Schmidt, “On the origin of resonance features in reflectance difference data of silicon,” Applied Surface Science, vol. 175–176, pp. 769–776, 2002, doi: 10.1016/s0169-4332(01)00114-3.
Hingerl, K., et al. “On the Origin of Resonance Features in Reflectance Difference Data of Silicon.” Applied Surface Science, vol. 175–176, 2002, pp. 769–76, doi:10.1016/s0169-4332(01)00114-3.
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