3.2 - Infrared reflectance measurements of thin films with time variable surface roughness or texture

C. Hoof, D. Wetzlar, B. Henning, in: LibreCat University, 2013.

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Conference Paper | English
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Publishing Year
Conference
11. Internationaler Kongress für Optische Technologien in Sensorik und Messtechnik (OPTO 2013)
Conference Location
Nürnberg
Conference Date
14.05.2013 – 16.05.2013
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Hoof C, Wetzlar D, Henning B. 3.2 - Infrared reflectance measurements of thin films with time variable surface roughness or texture. In: LibreCat University; 2013. doi:10.5162/OPTO2013/O3.2
Hoof, C., Wetzlar, D., & Henning, B. (2013). 3.2 - Infrared reflectance measurements of thin films with time variable surface roughness or texture. Presented at the 11. Internationaler Kongress für Optische Technologien in Sensorik und Messtechnik (OPTO 2013), Nürnberg: LibreCat University. https://doi.org/10.5162/OPTO2013/O3.2
@inproceedings{Hoof_Wetzlar_Henning_2013, title={3.2 - Infrared reflectance measurements of thin films with time variable surface roughness or texture}, DOI={10.5162/OPTO2013/O3.2}, publisher={LibreCat University}, author={Hoof, C. and Wetzlar, D. and Henning, Bernd}, year={2013} }
Hoof, C. , D. Wetzlar, and Bernd Henning. “3.2 - Infrared Reflectance Measurements of Thin Films with Time Variable Surface Roughness or Texture.” LibreCat University, 2013. https://doi.org/10.5162/OPTO2013/O3.2.
C. Hoof, D. Wetzlar, and B. Henning, “3.2 - Infrared reflectance measurements of thin films with time variable surface roughness or texture,” presented at the 11. Internationaler Kongress für Optische Technologien in Sensorik und Messtechnik (OPTO 2013), Nürnberg, 2013.
Hoof, C., et al. 3.2 - Infrared Reflectance Measurements of Thin Films with Time Variable Surface Roughness or Texture. LibreCat University, 2013, doi:10.5162/OPTO2013/O3.2.

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