3.2 - Infrared reflectance measurements of thin films with time variable surface roughness or texture
C. Hoof, D. Wetzlar, B. Henning, in: LibreCat University, 2013.
Download
No fulltext has been uploaded.
Conference Paper
| English
Author
Hoof, C. ;
Wetzlar, D. ;
Henning, BerndLibreCat
Department
Publishing Year
Conference
11. Internationaler Kongress für Optische Technologien in Sensorik und Messtechnik (OPTO 2013)
Conference Location
Nürnberg
Conference Date
14.05.2013 – 16.05.2013
LibreCat-ID
Cite this
Hoof C, Wetzlar D, Henning B. 3.2 - Infrared reflectance measurements of thin films with time variable surface roughness or texture. In: LibreCat University; 2013. doi:10.5162/OPTO2013/O3.2
Hoof, C., Wetzlar, D., & Henning, B. (2013). 3.2 - Infrared reflectance measurements of thin films with time variable surface roughness or texture. Presented at the 11. Internationaler Kongress für Optische Technologien in Sensorik und Messtechnik (OPTO 2013), Nürnberg: LibreCat University. https://doi.org/10.5162/OPTO2013/O3.2
@inproceedings{Hoof_Wetzlar_Henning_2013, title={3.2 - Infrared reflectance measurements of thin films with time variable surface roughness or texture}, DOI={10.5162/OPTO2013/O3.2}, publisher={LibreCat University}, author={Hoof, C. and Wetzlar, D. and Henning, Bernd}, year={2013} }
Hoof, C. , D. Wetzlar, and Bernd Henning. “3.2 - Infrared Reflectance Measurements of Thin Films with Time Variable Surface Roughness or Texture.” LibreCat University, 2013. https://doi.org/10.5162/OPTO2013/O3.2.
C. Hoof, D. Wetzlar, and B. Henning, “3.2 - Infrared reflectance measurements of thin films with time variable surface roughness or texture,” presented at the 11. Internationaler Kongress für Optische Technologien in Sensorik und Messtechnik (OPTO 2013), Nürnberg, 2013.
Hoof, C., et al. 3.2 - Infrared Reflectance Measurements of Thin Films with Time Variable Surface Roughness or Texture. LibreCat University, 2013, doi:10.5162/OPTO2013/O3.2.
Google Scholar