Validating Test Case Migration via Mutation Analysis
I. Jovanovikj, A. Nagaraj, E. Yigitbas, A. Anjorin, S. Sauer, G. Engels, in: Proceedings of the 1st IEEE/ACM International Conference on Automation of Software Test AST, ACM, 2020, pp. 31–40.
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Conference Paper
| English
Author
Jovanovikj, IvanLibreCat 
;
Nagaraj, Achyuth;
Yigitbas, EnesLibreCat ;
Anjorin, Anthony;
Sauer, StefanLibreCat;
Engels, GregorLibreCat
;
Nagaraj, Achyuth;
Yigitbas, EnesLibreCat ;
Anjorin, Anthony;
Sauer, StefanLibreCat;
Engels, GregorLibreCatPublishing Year
Proceedings Title
Proceedings of the 1st IEEE/ACM International Conference on Automation of Software Test AST
Page
31-40
Conference
1st IEEE/ACM International Conference on Automation of Software Test (AST 2020)
Conference Location
Seoul
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Cite this
Jovanovikj I, Nagaraj A, Yigitbas E, Anjorin A, Sauer S, Engels G. Validating Test Case Migration via Mutation Analysis . In: Proceedings of the 1st IEEE/ACM International Conference on Automation of Software Test AST. ACM; 2020:31-40.
Jovanovikj, I., Nagaraj, A., Yigitbas, E., Anjorin, A., Sauer, S., & Engels, G. (2020). Validating Test Case Migration via Mutation Analysis . In Proceedings of the 1st IEEE/ACM International Conference on Automation of Software Test AST (pp. 31–40). Seoul: ACM.
@inproceedings{Jovanovikj_Nagaraj_Yigitbas_Anjorin_Sauer_Engels_2020, title={Validating Test Case Migration via Mutation Analysis }, booktitle={Proceedings of the 1st IEEE/ACM International Conference on Automation of Software Test AST}, publisher={ACM}, author={Jovanovikj, Ivan and Nagaraj, Achyuth and Yigitbas, Enes and Anjorin, Anthony and Sauer, Stefan and Engels, Gregor}, year={2020}, pages={31–40} }
Jovanovikj, Ivan, Achyuth Nagaraj, Enes Yigitbas, Anthony Anjorin, Stefan Sauer, and Gregor Engels. “Validating Test Case Migration via Mutation Analysis .” In Proceedings of the 1st IEEE/ACM International Conference on Automation of Software Test AST, 31–40. ACM, 2020.
I. Jovanovikj, A. Nagaraj, E. Yigitbas, A. Anjorin, S. Sauer, and G. Engels, “Validating Test Case Migration via Mutation Analysis ,” in Proceedings of the 1st IEEE/ACM International Conference on Automation of Software Test AST, Seoul, 2020, pp. 31–40.
Jovanovikj, Ivan, et al. “Validating Test Case Migration via Mutation Analysis .” Proceedings of the 1st IEEE/ACM International Conference on Automation of Software Test AST, ACM, 2020, pp. 31–40.
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