Heaps'n Leaks: How Heap Snapshots Improve Android Taint Analysis

M. Benz, E. Krogh Kristensen, L. Luo, N. P. Borges Jr., E. Bodden, A. Zeller, in: International Conference for Software Engineering (ICSE), 2020.

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International Conference for Software Engineering (ICSE)
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Benz M, Krogh Kristensen E, Luo L, P. Borges Jr. N, Bodden E, Zeller A. Heaps’n Leaks: How Heap Snapshots Improve Android Taint Analysis. In: International Conference for Software Engineering (ICSE). ; 2020.
Benz, M., Krogh Kristensen, E., Luo, L., P. Borges Jr., N., Bodden, E., & Zeller, A. (2020). Heaps’n Leaks: How Heap Snapshots Improve Android Taint Analysis. In International Conference for Software Engineering (ICSE).
@inproceedings{Benz_Krogh Kristensen_Luo_P. Borges Jr._Bodden_Zeller_2020, title={Heaps’n Leaks: How Heap Snapshots Improve Android Taint Analysis}, booktitle={International Conference for Software Engineering (ICSE)}, author={Benz, Manuel and Krogh Kristensen, Erik and Luo, Linghui and P. Borges Jr., Nataniel and Bodden, Eric and Zeller, Andreas}, year={2020} }
Benz, Manuel, Erik Krogh Kristensen, Linghui Luo, Nataniel P. Borges Jr., Eric Bodden, and Andreas Zeller. “Heaps’n Leaks: How Heap Snapshots Improve Android Taint Analysis.” In International Conference for Software Engineering (ICSE), 2020.
M. Benz, E. Krogh Kristensen, L. Luo, N. P. Borges Jr., E. Bodden, and A. Zeller, “Heaps’n Leaks: How Heap Snapshots Improve Android Taint Analysis,” in International Conference for Software Engineering (ICSE), 2020.
Benz, Manuel, et al. “Heaps’n Leaks: How Heap Snapshots Improve Android Taint Analysis.” International Conference for Software Engineering (ICSE), 2020.

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