Heaps'n Leaks: How Heap Snapshots Improve Android Taint Analysis
M. Benz, E. Krogh Kristensen, L. Luo, N. P. Borges Jr., E. Bodden, A. Zeller, in: International Conference for Software Engineering (ICSE), 2020.
Download
No fulltext has been uploaded.
Conference Paper
| English
Author
Benz, Manuel;
Krogh Kristensen, Erik;
Luo, Linghui;
P. Borges Jr., Nataniel;
Bodden, EricLibreCat 
;
Zeller, Andreas
;
Zeller, AndreasPublishing Year
Proceedings Title
International Conference for Software Engineering (ICSE)
LibreCat-ID
Cite this
Benz M, Krogh Kristensen E, Luo L, P. Borges Jr. N, Bodden E, Zeller A. Heaps’n Leaks: How Heap Snapshots Improve Android Taint Analysis. In: International Conference for Software Engineering (ICSE). ; 2020.
Benz, M., Krogh Kristensen, E., Luo, L., P. Borges Jr., N., Bodden, E., & Zeller, A. (2020). Heaps’n Leaks: How Heap Snapshots Improve Android Taint Analysis. International Conference for Software Engineering (ICSE).
@inproceedings{Benz_Krogh Kristensen_Luo_P. Borges Jr._Bodden_Zeller_2020, title={Heaps’n Leaks: How Heap Snapshots Improve Android Taint Analysis}, booktitle={International Conference for Software Engineering (ICSE)}, author={Benz, Manuel and Krogh Kristensen, Erik and Luo, Linghui and P. Borges Jr., Nataniel and Bodden, Eric and Zeller, Andreas}, year={2020} }
Benz, Manuel, Erik Krogh Kristensen, Linghui Luo, Nataniel P. Borges Jr., Eric Bodden, and Andreas Zeller. “Heaps’n Leaks: How Heap Snapshots Improve Android Taint Analysis.” In International Conference for Software Engineering (ICSE), 2020.
M. Benz, E. Krogh Kristensen, L. Luo, N. P. Borges Jr., E. Bodden, and A. Zeller, “Heaps’n Leaks: How Heap Snapshots Improve Android Taint Analysis,” 2020.
Benz, Manuel, et al. “Heaps’n Leaks: How Heap Snapshots Improve Android Taint Analysis.” International Conference for Software Engineering (ICSE), 2020.
Google Scholar