Just-in-time Static Analysis

L.N.Q. Do, K. Ali, B. Livshits, E. Bodden, J. Smith, E. Murphy-Hill, in: Proceedings of the 26th ACM SIGSOFT International Symposium on Software Testing and Analysis, ACM, New York, NY, USA, 2017, pp. 307–317.

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Proceedings of the 26th ACM SIGSOFT International Symposium on Software Testing and Analysis
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307-317
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Do LNQ, Ali K, Livshits B, Bodden E, Smith J, Murphy-Hill E. Just-in-time Static Analysis. In: Proceedings of the 26th ACM SIGSOFT International Symposium on Software Testing and Analysis. ISSTA 2017. New York, NY, USA: ACM; 2017:307-317. doi:10.1145/3092703.3092705
Do, L. N. Q., Ali, K., Livshits, B., Bodden, E., Smith, J., & Murphy-Hill, E. (2017). Just-in-time Static Analysis. In Proceedings of the 26th ACM SIGSOFT International Symposium on Software Testing and Analysis (pp. 307–317). New York, NY, USA: ACM. https://doi.org/10.1145/3092703.3092705
@inproceedings{Do_Ali_Livshits_Bodden_Smith_Murphy-Hill_2017, place={New York, NY, USA}, series={ISSTA 2017}, title={Just-in-time Static Analysis}, DOI={10.1145/3092703.3092705}, booktitle={Proceedings of the 26th ACM SIGSOFT International Symposium on Software Testing and Analysis}, publisher={ACM}, author={Do, Lisa Nguyen Quang and Ali, Karim and Livshits, Benjamin and Bodden, Eric and Smith, Justin and Murphy-Hill, Emerson}, year={2017}, pages={307–317}, collection={ISSTA 2017} }
Do, Lisa Nguyen Quang, Karim Ali, Benjamin Livshits, Eric Bodden, Justin Smith, and Emerson Murphy-Hill. “Just-in-Time Static Analysis.” In Proceedings of the 26th ACM SIGSOFT International Symposium on Software Testing and Analysis, 307–17. ISSTA 2017. New York, NY, USA: ACM, 2017. https://doi.org/10.1145/3092703.3092705.
L. N. Q. Do, K. Ali, B. Livshits, E. Bodden, J. Smith, and E. Murphy-Hill, “Just-in-time Static Analysis,” in Proceedings of the 26th ACM SIGSOFT International Symposium on Software Testing and Analysis, 2017, pp. 307–317.
Do, Lisa Nguyen Quang, et al. “Just-in-Time Static Analysis.” Proceedings of the 26th ACM SIGSOFT International Symposium on Software Testing and Analysis, ACM, 2017, pp. 307–17, doi:10.1145/3092703.3092705.

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