X-ray photoelectron spectroscopy on implanted argon as a tool to follow local structural changes in thin films
A.R. Lahrood, M.T. de los Arcos de Pedro, M. Prenzel, A. von Keudell, J. Winter, Thin Solid Films (2011) 1625–1630.
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Journal Article
| Published
| English
Author
Lahrood, Atena Rastgoo;
de los Arcos de Pedro, Maria TeresaLibreCat;
Prenzel, Marina;
von Keudell, Achim;
Winter, Jörg
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Publishing Year
Journal Title
Thin Solid Films
Page
1625-1630
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LibreCat-ID
Cite this
Lahrood AR, de los Arcos de Pedro MT, Prenzel M, von Keudell A, Winter J. X-ray photoelectron spectroscopy on implanted argon as a tool to follow local structural changes in thin films. Thin Solid Films. Published online 2011:1625-1630. doi:10.1016/j.tsf.2011.07.040
Lahrood, A. R., de los Arcos de Pedro, M. T., Prenzel, M., von Keudell, A., & Winter, J. (2011). X-ray photoelectron spectroscopy on implanted argon as a tool to follow local structural changes in thin films. Thin Solid Films, 1625–1630. https://doi.org/10.1016/j.tsf.2011.07.040
@article{Lahrood_de los Arcos de Pedro_Prenzel_von Keudell_Winter_2011, title={X-ray photoelectron spectroscopy on implanted argon as a tool to follow local structural changes in thin films}, DOI={10.1016/j.tsf.2011.07.040}, journal={Thin Solid Films}, author={Lahrood, Atena Rastgoo and de los Arcos de Pedro, Maria Teresa and Prenzel, Marina and von Keudell, Achim and Winter, Jörg}, year={2011}, pages={1625–1630} }
Lahrood, Atena Rastgoo, Maria Teresa de los Arcos de Pedro, Marina Prenzel, Achim von Keudell, and Jörg Winter. “X-Ray Photoelectron Spectroscopy on Implanted Argon as a Tool to Follow Local Structural Changes in Thin Films.” Thin Solid Films, 2011, 1625–30. https://doi.org/10.1016/j.tsf.2011.07.040.
A. R. Lahrood, M. T. de los Arcos de Pedro, M. Prenzel, A. von Keudell, and J. Winter, “X-ray photoelectron spectroscopy on implanted argon as a tool to follow local structural changes in thin films,” Thin Solid Films, pp. 1625–1630, 2011, doi: 10.1016/j.tsf.2011.07.040.
Lahrood, Atena Rastgoo, et al. “X-Ray Photoelectron Spectroscopy on Implanted Argon as a Tool to Follow Local Structural Changes in Thin Films.” Thin Solid Films, 2011, pp. 1625–30, doi:10.1016/j.tsf.2011.07.040.
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