Characterization of Disorder in Semiconductors via Single-Photon Interferometry

P. Bozsoki, P. Thomas, M. Kira, W. Hoyer, T. Meier, S.W. Koch, K. Maschke, I. Varga, H. Stolz, Physical Review Letters (2006).

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Physical Review Letters
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Bozsoki P, Thomas P, Kira M, et al. Characterization of Disorder in Semiconductors via Single-Photon Interferometry. Physical Review Letters. 2006. doi:10.1103/physrevlett.97.227402
Bozsoki, P., Thomas, P., Kira, M., Hoyer, W., Meier, T., Koch, S. W., … Stolz, H. (2006). Characterization of Disorder in Semiconductors via Single-Photon Interferometry. Physical Review Letters. https://doi.org/10.1103/physrevlett.97.227402
@article{Bozsoki_Thomas_Kira_Hoyer_Meier_Koch_Maschke_Varga_Stolz_2006, title={Characterization of Disorder in Semiconductors via Single-Photon Interferometry}, DOI={10.1103/physrevlett.97.227402}, journal={Physical Review Letters}, author={Bozsoki, P. and Thomas, P. and Kira, M. and Hoyer, W. and Meier, Torsten and Koch, S. W. and Maschke, K. and Varga, I. and Stolz, H.}, year={2006} }
Bozsoki, P., P. Thomas, M. Kira, W. Hoyer, Torsten Meier, S. W. Koch, K. Maschke, I. Varga, and H. Stolz. “Characterization of Disorder in Semiconductors via Single-Photon Interferometry.” Physical Review Letters, 2006. https://doi.org/10.1103/physrevlett.97.227402.
P. Bozsoki et al., “Characterization of Disorder in Semiconductors via Single-Photon Interferometry,” Physical Review Letters, 2006.
Bozsoki, P., et al. “Characterization of Disorder in Semiconductors via Single-Photon Interferometry.” Physical Review Letters, 2006, doi:10.1103/physrevlett.97.227402.

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