Binary Mutation Testing Through Dynamic Translation
M. Becker, C. Kuznik, M. tech. M.M. Joy, T. Xie, W. Müller, in: 42nd Annual IEEE/IFIP International Conference on Dependable Systems and Networks (DSN), 2012.
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Author
Becker, Markus;
Kuznik, Christoph;
Joy, M. tech. Mabel Mary;
Xie, Tao;
Müller, WolfgangLibreCat
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42nd Annual IEEE/IFIP International Conference on Dependable Systems and Networks (DSN)
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Becker M, Kuznik C, Joy M tech. MM, Xie T, Müller W. Binary Mutation Testing Through Dynamic Translation. In: 42nd Annual IEEE/IFIP International Conference on Dependable Systems and Networks (DSN). ; 2012.
Becker, M., Kuznik, C., Joy, M. tech. M. M., Xie, T., & Müller, W. (2012). Binary Mutation Testing Through Dynamic Translation. 42nd Annual IEEE/IFIP International Conference on Dependable Systems and Networks (DSN).
@inproceedings{Becker_Kuznik_Joy_Xie_Müller_2012, title={Binary Mutation Testing Through Dynamic Translation}, booktitle={ 42nd Annual IEEE/IFIP International Conference on Dependable Systems and Networks (DSN)}, author={Becker, Markus and Kuznik, Christoph and Joy, M. tech. Mabel Mary and Xie, Tao and Müller, Wolfgang}, year={2012} }
Becker, Markus, Christoph Kuznik, M. tech. Mabel Mary Joy, Tao Xie, and Wolfgang Müller. “Binary Mutation Testing Through Dynamic Translation.” In 42nd Annual IEEE/IFIP International Conference on Dependable Systems and Networks (DSN), 2012.
M. Becker, C. Kuznik, M. tech. M. M. Joy, T. Xie, and W. Müller, “Binary Mutation Testing Through Dynamic Translation,” 2012.
Becker, Markus, et al. “Binary Mutation Testing Through Dynamic Translation.” 42nd Annual IEEE/IFIP International Conference on Dependable Systems and Networks (DSN), 2012.
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