XEMU: A QEMU Based Binary Mutation Testing Framework
M. Becker, C. Kuznik, M. tech. M. Joy, T. Xie, W. Müller, in: Design, Automation and Test in Europe DATE, University Booth, Dresden, 2012.
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Becker, Markus;
Kuznik, Christoph;
Joy, M. tech. Mabel;
Xie, Tao;
Müller, WolfgangLibreCat
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Design, Automation and Test in Europe DATE
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Becker M, Kuznik C, Joy M tech. M, Xie T, Müller W. XEMU: A QEMU Based Binary Mutation Testing Framework. In: Design, Automation and Test in Europe DATE. ; 2012.
Becker, M., Kuznik, C., Joy, M. tech. M., Xie, T., & Müller, W. (2012). XEMU: A QEMU Based Binary Mutation Testing Framework. Design, Automation and Test in Europe DATE.
@inproceedings{Becker_Kuznik_Joy_Xie_Müller_2012, place={University Booth, Dresden}, title={XEMU: A QEMU Based Binary Mutation Testing Framework}, booktitle={Design, Automation and Test in Europe DATE}, author={Becker, Markus and Kuznik, Christoph and Joy, M. tech. Mabel and Xie, Tao and Müller, Wolfgang}, year={2012} }
Becker, Markus, Christoph Kuznik, M. tech. Mabel Joy, Tao Xie, and Wolfgang Müller. “XEMU: A QEMU Based Binary Mutation Testing Framework.” In Design, Automation and Test in Europe DATE. University Booth, Dresden, 2012.
M. Becker, C. Kuznik, M. tech. M. Joy, T. Xie, and W. Müller, “XEMU: A QEMU Based Binary Mutation Testing Framework,” 2012.
Becker, Markus, et al. “XEMU: A QEMU Based Binary Mutation Testing Framework.” Design, Automation and Test in Europe DATE, 2012.
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