Benchmark Fuzzing for Android Taint Analyses
S. Schott, F. Pauck, in: 2022 IEEE 22nd International Working Conference on Source Code Analysis and Manipulation (SCAM), IEEE, 2023.
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2022 IEEE 22nd International Working Conference on Source Code Analysis and Manipulation (SCAM)
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Schott S, Pauck F. Benchmark Fuzzing for Android Taint Analyses. In: 2022 IEEE 22nd International Working Conference on Source Code Analysis and Manipulation (SCAM). IEEE; 2023. doi:10.1109/scam55253.2022.00007
Schott, S., & Pauck, F. (2023). Benchmark Fuzzing for Android Taint Analyses. 2022 IEEE 22nd International Working Conference on Source Code Analysis and Manipulation (SCAM). https://doi.org/10.1109/scam55253.2022.00007
@inproceedings{Schott_Pauck_2023, title={Benchmark Fuzzing for Android Taint Analyses}, DOI={10.1109/scam55253.2022.00007}, booktitle={2022 IEEE 22nd International Working Conference on Source Code Analysis and Manipulation (SCAM)}, publisher={IEEE}, author={Schott, Stefan and Pauck, Felix}, year={2023} }
Schott, Stefan, and Felix Pauck. “Benchmark Fuzzing for Android Taint Analyses.” In 2022 IEEE 22nd International Working Conference on Source Code Analysis and Manipulation (SCAM). IEEE, 2023. https://doi.org/10.1109/scam55253.2022.00007.
S. Schott and F. Pauck, “Benchmark Fuzzing for Android Taint Analyses,” 2023, doi: 10.1109/scam55253.2022.00007.
Schott, Stefan, and Felix Pauck. “Benchmark Fuzzing for Android Taint Analyses.” 2022 IEEE 22nd International Working Conference on Source Code Analysis and Manipulation (SCAM), IEEE, 2023, doi:10.1109/scam55253.2022.00007.
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