A Systematic Approach to Combined HW/SW System Test
A. Krupp, W. Müller, in: Proceedings of DATE’10, IEEE, Dresden, 2010.
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Author
Krupp, Alexander;
Müller, WolfgangLibreCat
Abstract
Today we can identify a big gap between requirement specification and the generation of test environments. This article extends the Classification Tree Method for Embedded Systems (CTM/ES) to fill this gap by new concepts for the precise specification of stimuli for operational ranges of continuous control systems. It introduces novel means for continuous acceptance criteria definition and for functional coverage definition.
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Proceedings Title
Proceedings of DATE’10
Conference
Design, Automation & Test in Europe Conference & Exhibition (DATE 2010)
Conference Location
Dresden
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Krupp A, Müller W. A Systematic Approach to Combined HW/SW System Test. In: Proceedings of DATE’10. IEEE; 2010. doi:10.1109/DATE.2010.5457186
Krupp, A., & Müller, W. (2010). A Systematic Approach to Combined HW/SW System Test. Proceedings of DATE’10. Design, Automation & Test in Europe Conference & Exhibition (DATE 2010), Dresden. https://doi.org/10.1109/DATE.2010.5457186
@inproceedings{Krupp_Müller_2010, place={Dresden}, title={A Systematic Approach to Combined HW/SW System Test}, DOI={10.1109/DATE.2010.5457186}, booktitle={Proceedings of DATE’10}, publisher={IEEE}, author={Krupp, Alexander and Müller, Wolfgang}, year={2010} }
Krupp, Alexander, and Wolfgang Müller. “A Systematic Approach to Combined HW/SW System Test.” In Proceedings of DATE’10. Dresden: IEEE, 2010. https://doi.org/10.1109/DATE.2010.5457186.
A. Krupp and W. Müller, “A Systematic Approach to Combined HW/SW System Test,” presented at the Design, Automation & Test in Europe Conference & Exhibition (DATE 2010), Dresden, 2010, doi: 10.1109/DATE.2010.5457186.
Krupp, Alexander, and Wolfgang Müller. “A Systematic Approach to Combined HW/SW System Test.” Proceedings of DATE’10, IEEE, 2010, doi:10.1109/DATE.2010.5457186.
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