Explaining Face Recognition Through SHAP-Based Pixel-Level Face Image Quality Assessment
C. Biagi, L. Rethfeld, A. Kuijper, P. Terhörst, in: 2023 IEEE International Joint Conference on Biometrics (IJCB), IEEE, 2023.
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Conference Paper
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| English
Author
Biagi, Clara;
Rethfeld, Louis;
Kuijper, Arjan;
Terhörst, PhilippLibreCat
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Proceedings Title
2023 IEEE International Joint Conference on Biometrics (IJCB)
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Biagi C, Rethfeld L, Kuijper A, Terhörst P. Explaining Face Recognition Through SHAP-Based Pixel-Level Face Image Quality Assessment. In: 2023 IEEE International Joint Conference on Biometrics (IJCB). IEEE; 2023. doi:10.1109/ijcb57857.2023.10448905
Biagi, C., Rethfeld, L., Kuijper, A., & Terhörst, P. (2023). Explaining Face Recognition Through SHAP-Based Pixel-Level Face Image Quality Assessment. 2023 IEEE International Joint Conference on Biometrics (IJCB). https://doi.org/10.1109/ijcb57857.2023.10448905
@inproceedings{Biagi_Rethfeld_Kuijper_Terhörst_2023, title={Explaining Face Recognition Through SHAP-Based Pixel-Level Face Image Quality Assessment}, DOI={10.1109/ijcb57857.2023.10448905}, booktitle={2023 IEEE International Joint Conference on Biometrics (IJCB)}, publisher={IEEE}, author={Biagi, Clara and Rethfeld, Louis and Kuijper, Arjan and Terhörst, Philipp}, year={2023} }
Biagi, Clara, Louis Rethfeld, Arjan Kuijper, and Philipp Terhörst. “Explaining Face Recognition Through SHAP-Based Pixel-Level Face Image Quality Assessment.” In 2023 IEEE International Joint Conference on Biometrics (IJCB). IEEE, 2023. https://doi.org/10.1109/ijcb57857.2023.10448905.
C. Biagi, L. Rethfeld, A. Kuijper, and P. Terhörst, “Explaining Face Recognition Through SHAP-Based Pixel-Level Face Image Quality Assessment,” 2023, doi: 10.1109/ijcb57857.2023.10448905.
Biagi, Clara, et al. “Explaining Face Recognition Through SHAP-Based Pixel-Level Face Image Quality Assessment.” 2023 IEEE International Joint Conference on Biometrics (IJCB), IEEE, 2023, doi:10.1109/ijcb57857.2023.10448905.
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