IR hot carrier based photodetection in titanium nitride oxide thin film-Si junctions
N.A. Güsken, A. Lauri, Y. Li, A. Jacassi, T. Matsui, B. Doiron, R. Bower, A. Regoutz, A. Mihai, P.K. Petrov, R.F. Oulton, L.F. Cohen, S.A. Maier, MRS Advances 5 (2020) 1843–1850.
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Journal Article
| Published
| English
Author
Güsken, Nicholas AlexanderLibreCat 
;
Lauri, Alberto;
Li, Yi;
Jacassi, Andrea;
Matsui, Takayuki;
Doiron, Brock;
Bower, Ryan;
Regoutz, Anna;
Mihai, Andrei;
Petrov, Peter K.;
Oulton, Rupert F.;
Cohen, Lesley F.
All
;
Lauri, Alberto;
Li, Yi;
Jacassi, Andrea;
Matsui, Takayuki;
Doiron, Brock;
Bower, Ryan;
Regoutz, Anna;
Mihai, Andrei;
Petrov, Peter K.;
Oulton, Rupert F.;
Cohen, Lesley F.
All
Department
Publishing Year
Journal Title
MRS Advances
Volume
5
Issue
35-36
Page
1843-1850
ISSN
LibreCat-ID
Cite this
Güsken NA, Lauri A, Li Y, et al. IR hot carrier based photodetection in titanium nitride oxide thin film-Si junctions. MRS Advances. 2020;5(35-36):1843-1850. doi:10.1557/adv.2020.129
Güsken, N. A., Lauri, A., Li, Y., Jacassi, A., Matsui, T., Doiron, B., Bower, R., Regoutz, A., Mihai, A., Petrov, P. K., Oulton, R. F., Cohen, L. F., & Maier, S. A. (2020). IR hot carrier based photodetection in titanium nitride oxide thin film-Si junctions. MRS Advances, 5(35–36), 1843–1850. https://doi.org/10.1557/adv.2020.129
@article{Güsken_Lauri_Li_Jacassi_Matsui_Doiron_Bower_Regoutz_Mihai_Petrov_et al._2020, title={IR hot carrier based photodetection in titanium nitride oxide thin film-Si junctions}, volume={5}, DOI={10.1557/adv.2020.129}, number={35–36}, journal={MRS Advances}, publisher={Springer Science and Business Media LLC}, author={Güsken, Nicholas Alexander and Lauri, Alberto and Li, Yi and Jacassi, Andrea and Matsui, Takayuki and Doiron, Brock and Bower, Ryan and Regoutz, Anna and Mihai, Andrei and Petrov, Peter K. and et al.}, year={2020}, pages={1843–1850} }
Güsken, Nicholas Alexander, Alberto Lauri, Yi Li, Andrea Jacassi, Takayuki Matsui, Brock Doiron, Ryan Bower, et al. “IR Hot Carrier Based Photodetection in Titanium Nitride Oxide Thin Film-Si Junctions.” MRS Advances 5, no. 35–36 (2020): 1843–50. https://doi.org/10.1557/adv.2020.129.
N. A. Güsken et al., “IR hot carrier based photodetection in titanium nitride oxide thin film-Si junctions,” MRS Advances, vol. 5, no. 35–36, pp. 1843–1850, 2020, doi: 10.1557/adv.2020.129.
Güsken, Nicholas Alexander, et al. “IR Hot Carrier Based Photodetection in Titanium Nitride Oxide Thin Film-Si Junctions.” MRS Advances, vol. 5, no. 35–36, Springer Science and Business Media LLC, 2020, pp. 1843–50, doi:10.1557/adv.2020.129.
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