Analyzing Fairness in Deepfake Detection With Massively Annotated Databases
Y. Xu, P. Terhörst, M. Pedersen, K. Raja, IEEE Transactions on Technology and Society 5 (2024) 93–106.
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Journal Article
| Published
| English
Author
Xu, Ying;
Terhörst, PhilippLibreCat;
Pedersen, Marius;
Raja, Kiran
Publishing Year
Journal Title
IEEE Transactions on Technology and Society
Volume
5
Issue
1
Page
93-106
ISSN
LibreCat-ID
Cite this
Xu Y, Terhörst P, Pedersen M, Raja K. Analyzing Fairness in Deepfake Detection With Massively Annotated Databases. IEEE Transactions on Technology and Society. 2024;5(1):93-106. doi:10.1109/tts.2024.3365421
Xu, Y., Terhörst, P., Pedersen, M., & Raja, K. (2024). Analyzing Fairness in Deepfake Detection With Massively Annotated Databases. IEEE Transactions on Technology and Society, 5(1), 93–106. https://doi.org/10.1109/tts.2024.3365421
@article{Xu_Terhörst_Pedersen_Raja_2024, title={Analyzing Fairness in Deepfake Detection With Massively Annotated Databases}, volume={5}, DOI={10.1109/tts.2024.3365421}, number={1}, journal={IEEE Transactions on Technology and Society}, publisher={Institute of Electrical and Electronics Engineers (IEEE)}, author={Xu, Ying and Terhörst, Philipp and Pedersen, Marius and Raja, Kiran}, year={2024}, pages={93–106} }
Xu, Ying, Philipp Terhörst, Marius Pedersen, and Kiran Raja. “Analyzing Fairness in Deepfake Detection With Massively Annotated Databases.” IEEE Transactions on Technology and Society 5, no. 1 (2024): 93–106. https://doi.org/10.1109/tts.2024.3365421.
Y. Xu, P. Terhörst, M. Pedersen, and K. Raja, “Analyzing Fairness in Deepfake Detection With Massively Annotated Databases,” IEEE Transactions on Technology and Society, vol. 5, no. 1, pp. 93–106, 2024, doi: 10.1109/tts.2024.3365421.
Xu, Ying, et al. “Analyzing Fairness in Deepfake Detection With Massively Annotated Databases.” IEEE Transactions on Technology and Society, vol. 5, no. 1, Institute of Electrical and Electronics Engineers (IEEE), 2024, pp. 93–106, doi:10.1109/tts.2024.3365421.
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