Pattern-based Generation of Test Plans for Open Distributed Processing Systems
B. Güldali, S. Sauer, P. Winkelhane, M. Jahnich, H. Funke, in: Proceedings of 5th International Workshop on Automation of Software Test (AST 2010), ICSE Workshop, ACM Press, 2010, pp. 119–126.
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Güldali, Baris;
Sauer, StefanLibreCat;
Winkelhane, Peter;
Jahnich, Michael;
Funke, Holger
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Proceedings Title
Proceedings of 5th International Workshop on Automation of Software Test (AST 2010), ICSE Workshop
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119-126
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Güldali B, Sauer S, Winkelhane P, Jahnich M, Funke H. Pattern-based Generation of Test Plans for Open Distributed Processing Systems. In: Proceedings of 5th International Workshop on Automation of Software Test (AST 2010), ICSE Workshop. ACM Press; 2010:119-126.
Güldali, B., Sauer, S., Winkelhane, P., Jahnich, M., & Funke, H. (2010). Pattern-based Generation of Test Plans for Open Distributed Processing Systems. In Proceedings of 5th International Workshop on Automation of Software Test (AST 2010), ICSE Workshop (pp. 119–126). ACM Press.
@inproceedings{Güldali_Sauer_Winkelhane_Jahnich_Funke_2010, title={Pattern-based Generation of Test Plans for Open Distributed Processing Systems}, booktitle={Proceedings of 5th International Workshop on Automation of Software Test (AST 2010), ICSE Workshop}, publisher={ACM Press}, author={Güldali, Baris and Sauer, Stefan and Winkelhane, Peter and Jahnich, Michael and Funke, Holger}, year={2010}, pages={119–126} }
Güldali, Baris, Stefan Sauer, Peter Winkelhane, Michael Jahnich, and Holger Funke. “Pattern-Based Generation of Test Plans for Open Distributed Processing Systems.” In Proceedings of 5th International Workshop on Automation of Software Test (AST 2010), ICSE Workshop, 119–26. ACM Press, 2010.
B. Güldali, S. Sauer, P. Winkelhane, M. Jahnich, and H. Funke, “Pattern-based Generation of Test Plans for Open Distributed Processing Systems,” in Proceedings of 5th International Workshop on Automation of Software Test (AST 2010), ICSE Workshop, 2010, pp. 119–126.
Güldali, Baris, et al. “Pattern-Based Generation of Test Plans for Open Distributed Processing Systems.” Proceedings of 5th International Workshop on Automation of Software Test (AST 2010), ICSE Workshop, ACM Press, 2010, pp. 119–26.
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