Influence of processing parameters on the transport properties of quantum point contacts fabricated with an atomic force microscope
G. Apetrii, S.F. Fischer, U. Kunze, D. Reuter, A.D. Wieck, Semiconductor Science and Technology (2003) 735–739.
Download
No fulltext has been uploaded.
Journal Article
| Published
| English
Author
Apetrii, G;
Fischer, S F;
Kunze, U;
Reuter, DirkLibreCat;
Wieck, A D
Publishing Year
Journal Title
Semiconductor Science and Technology
Page
735-739
ISSN
LibreCat-ID
Cite this
Apetrii G, Fischer SF, Kunze U, Reuter D, Wieck AD. Influence of processing parameters on the transport properties of quantum point contacts fabricated with an atomic force microscope. Semiconductor Science and Technology. 2003:735-739. doi:10.1088/0268-1242/17/7/317
Apetrii, G., Fischer, S. F., Kunze, U., Reuter, D., & Wieck, A. D. (2003). Influence of processing parameters on the transport properties of quantum point contacts fabricated with an atomic force microscope. Semiconductor Science and Technology, 735–739. https://doi.org/10.1088/0268-1242/17/7/317
@article{Apetrii_Fischer_Kunze_Reuter_Wieck_2003, title={Influence of processing parameters on the transport properties of quantum point contacts fabricated with an atomic force microscope}, DOI={10.1088/0268-1242/17/7/317}, journal={Semiconductor Science and Technology}, author={Apetrii, G and Fischer, S F and Kunze, U and Reuter, Dirk and Wieck, A D}, year={2003}, pages={735–739} }
Apetrii, G, S F Fischer, U Kunze, Dirk Reuter, and A D Wieck. “Influence of Processing Parameters on the Transport Properties of Quantum Point Contacts Fabricated with an Atomic Force Microscope.” Semiconductor Science and Technology, 2003, 735–39. https://doi.org/10.1088/0268-1242/17/7/317.
G. Apetrii, S. F. Fischer, U. Kunze, D. Reuter, and A. D. Wieck, “Influence of processing parameters on the transport properties of quantum point contacts fabricated with an atomic force microscope,” Semiconductor Science and Technology, pp. 735–739, 2003.
Apetrii, G., et al. “Influence of Processing Parameters on the Transport Properties of Quantum Point Contacts Fabricated with an Atomic Force Microscope.” Semiconductor Science and Technology, 2003, pp. 735–39, doi:10.1088/0268-1242/17/7/317.
Google Scholar