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199 Publications
2007 | Journal Article | LibreCat-ID: 39561
Scharnberg, M., V. Zaporojtchenko, R. Adelung, F. Faupel, C. Pannemann, T. Diekmann, and Ulrich Hilleringmann. “Tuning the Threshold Voltage of Organic Field-Effect Transistors by an Electret Encapsulating Layer.” Applied Physics Letters 90, no. 1 (2007). https://doi.org/10.1063/1.2426926.
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2007 | Journal Article | LibreCat-ID: 39563
Jiang, Jianliang, Ulrich Hilleringmann, and Xiaoping Shui. “Electro-Thermo-Mechanical Analytical Modeling of Multilayer Cantilever Microactuator.” Sensors and Actuators A: Physical 137, no. 2 (2007): 302–7. https://doi.org/10.1016/j.sna.2007.03.012.
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2007 | Conference Paper | LibreCat-ID: 39567
Wiegand, C., C. Hedayat, W. John, Lj. Radic-Weissenfeld, and Ulrich Hilleringmann. “Nonlinear Identification of Complex Systems Using Radial Basis Function Networks and Model Order Reduction.” In 2007 IEEE International Symposium on Electromagnetic Compatibility. IEEE, 2007. https://doi.org/10.1109/isemc.2007.145.
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2007 | Conference Paper | LibreCat-ID: 39573
Scholz, P., M. Dierkes, and Ulrich Hilleringmann. “6I-3 Low-Cost Transceiver Unit for SAW-Sensors Using Customized Hardware Components.” In 2006 IEEE Ultrasonics Symposium. IEEE, 2007. https://doi.org/10.1109/ultsym.2006.223.
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2006 | Conference Paper | LibreCat-ID: 39842
Pannemann, C., T. Diekmann, Ulrich Hilleringmann, U. Schurmann, M. Scharnberg, V. Zaporojtchenko, R. Adelung, and F. Faupel. “Encapsulating the Active Layer of Organic Thin-Film Transistors.” In Polytronic 2005 - 5th International Conference on Polymers and Adhesives in Microelectronics and Photonics. IEEE, 2006. https://doi.org/10.1109/polytr.2005.1596488.
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2005 | Journal Article | LibreCat-ID: 39846
Pannemann, Ch., T. Diekmann, and Ulrich Hilleringmann. “Degradation of Organic Field-Effect Transistors Made of Pentacene.” Journal of Materials Research 19, no. 7 (2005): 1999–2002. https://doi.org/10.1557/jmr.2004.0267.
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2005 | Conference Paper | LibreCat-ID: 39848
Pannemann, Ch., T. Diekmann, and Ulrich Hilleringmann. “On the Degradation of Organic Field-Effect Transistors.” In Proceedings. The 16th International Conference on Microelectronics, 2004. ICM 2004. IEEE, 2005. https://doi.org/10.1109/icm.2004.1434210.
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2005 | Journal Article | LibreCat-ID: 39349
Pannemann, Ch., T. Diekmann, and Ulrich Hilleringmann. “Degradation of Organic Field-Effect Transistors Made of Pentacene.” Journal of Materials Research 19, no. 7 (2005): 1999–2002. https://doi.org/10.1557/jmr.2004.0267.
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2005 | Journal Article | LibreCat-ID: 39574
Scharnberg, M., J. Hu, J. Kanzow, K. Rätzke, R. Adelung, F. Faupel, C. Pannemann, Ulrich Hilleringmann, S. Meyer, and J. Pflaum. “Radiotracer Measurements as a Sensitive Tool for the Detection of Metal Penetration in Molecular-Based Organic Electronics.” Applied Physics Letters 86, no. 2 (2005). https://doi.org/10.1063/1.1849845.
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2005 | Conference Paper | LibreCat-ID: 39835
Scholz, R., A.-D. Müller, F. Müller, I. Thurzo, B. A. Paez, L. Mancera, D. R. T. Zahn, C. Pannemann, and Ulrich Hilleringmann. “Comparison between the Charge Carrier Mobilities in Pentacene OFET Structures as Obtained from Electrical Characterization and Potentiometry.” In SPIE Proceedings, edited by Zhenan Bao and David J. Gundlach. SPIE, 2005. https://doi.org/10.1117/12.617004.
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2005 | Conference Paper | LibreCat-ID: 39834
Scholz, R., A.-D. Müller, F. Müller, I. Thurzo, B. A. Paez, L. Mancera, D. R. T. Zahn, C. Pannemann, and Ulrich Hilleringmann. “Comparison between the Charge Carrier Mobilities in Pentacene OFET Structures as Obtained from Electrical Characterization and Potentiometry.” In SPIE Proceedings, edited by Zhenan Bao and David J. Gundlach. SPIE, 2005. https://doi.org/10.1117/12.617004.
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2004 | Book Chapter | LibreCat-ID: 39850
Hilleringmann, Ulrich. “Ätztechnik.” In Silizium-Halbleitertechnologie, 65–90. Wiesbaden: Vieweg+Teubner Verlag, 2004. https://doi.org/10.1007/978-3-322-94072-8_5.
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2004 | Conference Paper | LibreCat-ID: 39872
Hilleringmann, Ulrich, and C. Pannemann. “Imprint Structured Organic Thin Film Transistors as Driving Circuit in Single-Use Sensor Applications.” In Fifth International Symposium on Instrumentation and Control Technology, edited by Guangjun Zhang, Huijie Zhao, and Zhongyu Wang. SPIE, 2004. https://doi.org/10.1117/12.521463.
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2004 | Conference Paper | LibreCat-ID: 39873
Otterbach, Ralf, and Ulrich Hilleringmann. “Piezoresistive Pressure Sensors in CVD Diamond for High-Temperature Applications.” In Fifth International Symposium on Instrumentation and Control Technology, edited by Guangjun Zhang, Huijie Zhao, and Zhongyu Wang. SPIE, 2004. https://doi.org/10.1117/12.521928.
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2003 | Conference Paper | LibreCat-ID: 39887
Hilleringmann, Ulrich, T. Vieregge, and J.T. Horstmann. “Masking and Etching of Silicon and Related Materials for Geometries down to 25 Nm.” In IECON’99. Conference Proceedings. 25th Annual Conference of the IEEE Industrial Electronics Society (Cat. No.99CH37029). IEEE, 2003. https://doi.org/10.1109/iecon.1999.822171.
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2003 | Conference Paper | LibreCat-ID: 39888
Horstmann, J.T., Ulrich Hilleringmann, and K. Goser. “Matching Analysis of NMOS-Transistors with a Channel Length down to 30 Nm.” In IECON’99. Conference Proceedings. 25th Annual Conference of the IEEE Industrial Electronics Society (Cat. No.99CH37029). IEEE, 2003. https://doi.org/10.1109/iecon.1999.822163.
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2003 | Conference Paper | LibreCat-ID: 39885
Wirth, G., Ulrich Hilleringmann, J.T. Horstmann, and K. Goser. “Negative Differential Resistance in Ultrashort Bulk MOSFETs.” In IECON’99. Conference Proceedings. 25th Annual Conference of the IEEE Industrial Electronics Society (Cat. No.99CH37029). IEEE, 2003. https://doi.org/10.1109/iecon.1999.822164.
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2003 | Journal Article | LibreCat-ID: 39851
Pannemann, Ch., T. Diekmann, and Ulrich Hilleringmann. “Nanometer Scale Organic Thin Film Transistors with Pentacene.” Microelectronic Engineering 67–68 (2003): 845–52. https://doi.org/10.1016/s0167-9317(03)00146-1.
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2002 | Journal Article | LibreCat-ID: 39904
Hilleringmann, Ulrich, and K. Goser. “Optoelectronic System Integration on Silicon: Waveguides, Photodetectors, and VLSI CMOS Circuits on One Chip.” IEEE Transactions on Electron Devices 42, no. 5 (2002): 841–46. https://doi.org/10.1109/16.381978.
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2002 | Journal Article | LibreCat-ID: 39912
Schönstein, I., J. Müller, Ulrich Hilleringmann, and K. Goser. “Characterization of Submicron NMOS Devices Due to Visible Light Emission.” Microelectronic Engineering 21, no. 1–4 (2002): 363–66. https://doi.org/10.1016/0167-9317(93)90092-j.
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