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1 Publication
2013 | Journal Article | LibreCat-ID: 7286
Bussone, Genziana, Rüdiger Schott, Andreas Biermanns, Anton Davydok, Dirk Reuter, Gerardina Carbone, Tobias U. Schülli, Andreas D. Wieck, and Ullrich Pietsch. “Grazing-Incidence X-Ray Diffraction of Single GaAs Nanowires at Locations Defined by Focused Ion Beams.” Journal of Applied Crystallography 46, no. 4 (2013): 887–92. https://doi.org/10.1107/s0021889813004226.
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