Grazing-incidence X-ray diffraction of single GaAs nanowires at locations defined by focused ion beams
G. Bussone, R. Schott, A. Biermanns, A. Davydok, D. Reuter, G. Carbone, T.U. Schülli, A.D. Wieck, U. Pietsch, Journal of Applied Crystallography 46 (2013) 887–892.
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Journal Article
| Published
| English
Author
Bussone, Genziana;
Schott, Rüdiger;
Biermanns, Andreas;
Davydok, Anton;
Reuter, DirkLibreCat;
Carbone, Gerardina;
Schülli, Tobias U.;
Wieck, Andreas D.;
Pietsch, Ullrich
Publishing Year
Journal Title
Journal of Applied Crystallography
Volume
46
Issue
4
Page
887-892
ISSN
LibreCat-ID
Cite this
Bussone G, Schott R, Biermanns A, et al. Grazing-incidence X-ray diffraction of single GaAs nanowires at locations defined by focused ion beams. Journal of Applied Crystallography. 2013;46(4):887-892. doi:10.1107/s0021889813004226
Bussone, G., Schott, R., Biermanns, A., Davydok, A., Reuter, D., Carbone, G., … Pietsch, U. (2013). Grazing-incidence X-ray diffraction of single GaAs nanowires at locations defined by focused ion beams. Journal of Applied Crystallography, 46(4), 887–892. https://doi.org/10.1107/s0021889813004226
@article{Bussone_Schott_Biermanns_Davydok_Reuter_Carbone_Schülli_Wieck_Pietsch_2013, title={Grazing-incidence X-ray diffraction of single GaAs nanowires at locations defined by focused ion beams}, volume={46}, DOI={10.1107/s0021889813004226}, number={4}, journal={Journal of Applied Crystallography}, publisher={International Union of Crystallography (IUCr)}, author={Bussone, Genziana and Schott, Rüdiger and Biermanns, Andreas and Davydok, Anton and Reuter, Dirk and Carbone, Gerardina and Schülli, Tobias U. and Wieck, Andreas D. and Pietsch, Ullrich}, year={2013}, pages={887–892} }
Bussone, Genziana, Rüdiger Schott, Andreas Biermanns, Anton Davydok, Dirk Reuter, Gerardina Carbone, Tobias U. Schülli, Andreas D. Wieck, and Ullrich Pietsch. “Grazing-Incidence X-Ray Diffraction of Single GaAs Nanowires at Locations Defined by Focused Ion Beams.” Journal of Applied Crystallography 46, no. 4 (2013): 887–92. https://doi.org/10.1107/s0021889813004226.
G. Bussone et al., “Grazing-incidence X-ray diffraction of single GaAs nanowires at locations defined by focused ion beams,” Journal of Applied Crystallography, vol. 46, no. 4, pp. 887–892, 2013.
Bussone, Genziana, et al. “Grazing-Incidence X-Ray Diffraction of Single GaAs Nanowires at Locations Defined by Focused Ion Beams.” Journal of Applied Crystallography, vol. 46, no. 4, International Union of Crystallography (IUCr), 2013, pp. 887–92, doi:10.1107/s0021889813004226.
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