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1 Publication
2013 | Journal Article | LibreCat-ID: 7286
Bussone, Genziana, et al. “Grazing-Incidence X-Ray Diffraction of Single GaAs Nanowires at Locations Defined by Focused Ion Beams.” Journal of Applied Crystallography, vol. 46, no. 4, International Union of Crystallography (IUCr), 2013, pp. 887–92, doi:10.1107/s0021889813004226.
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