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1 Publication
2013 | Journal Article | LibreCat-ID: 7286
Bussone, G., Schott, R., Biermanns, A., Davydok, A., Reuter, D., Carbone, G., … Pietsch, U. (2013). Grazing-incidence X-ray diffraction of single GaAs nanowires at locations defined by focused ion beams. Journal of Applied Crystallography, 46(4), 887–892. https://doi.org/10.1107/s0021889813004226
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