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148 Publications


2002 | Journal Article | LibreCat-ID: 39348
Horstmann, J. T., et al. “Matching Analysis of Deposition Defined 50-Nm MOSFET’s.” IEEE Transactions on Electron Devices, vol. 45, no. 1, Institute of Electrical and Electronics Engineers (IEEE), 2002, pp. 299–306, doi:10.1109/16.658845.
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2002 | Journal Article | LibreCat-ID: 39889
Mankowski, V., et al. “12 KV Low Current Cascaded Light Triggered Switch on One Silicon Chip.” Microelectronic Engineering, vol. 46, no. 1–4, Elsevier BV, 2002, pp. 413–17, doi:10.1016/s0167-9317(99)00122-7.
LibreCat | DOI
 

2002 | Journal Article | LibreCat-ID: 39891
Horstmann, J. T., et al. “Matching Analysis of Deposition Defined 50-Nm MOSFET’s.” IEEE Transactions on Electron Devices, vol. 45, no. 1, Institute of Electrical and Electronics Engineers (IEEE), 2002, pp. 299–306, doi:10.1109/16.658845.
LibreCat | DOI
 

2002 | Journal Article | LibreCat-ID: 39886
Wirth, G., et al. “Mesoscopic Transport Phenomena in Ultrashort Channel MOSFETs.” Solid-State Electronics, vol. 43, no. 7, Elsevier BV, 2002, pp. 1245–50, doi:10.1016/s0038-1101(99)00060-x.
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2002 | Journal Article | LibreCat-ID: 39876
Otterbach, R., et al. “Structures with a Minimum Feature Size of Less than 100 Nm in CVD-Diamond for Sensor Applications.” Diamond and Related Materials, vol. 10, no. 3–7, Elsevier BV, 2002, pp. 511–14, doi:10.1016/s0925-9635(01)00373-9.
LibreCat | DOI
 

2002 | Journal Article | LibreCat-ID: 39877
Hilleringmann, Ulrich, et al. “A Structure Definition Technique for 25 Nm Lines of Silicon and Related Materials.” Microelectronic Engineering, vol. 53, no. 1–4, Elsevier BV, 2002, pp. 569–72, doi:10.1016/s0167-9317(00)00380-4.
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2002 | Journal Article | LibreCat-ID: 39874
Otterbach, R., and Ulrich Hilleringmann. “Reactive Ion Etching of CVD-Diamond for Piezoresistive Pressure Sensors.” Diamond and Related Materials, vol. 11, no. 3–6, Elsevier BV, 2002, pp. 841–44, doi:10.1016/s0925-9635(01)00703-8.
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1995 | Journal Article | LibreCat-ID: 30050
Grotstollen, H., and J. Wiesing. “Torque Capability and Control of a Saturated Induction Motor over a Wide Range of Flux Weakening.” IEEE Transactions on Industrial Electronics, vol. 42, no. 4, Institute of Electrical and Electronics Engineers (IEEE), 1995, pp. 374–81, doi:10.1109/41.402476.
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