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7 Publications


2023 | Journal Article | LibreCat-ID: 46487
Zander, K.K., D. Nguyen, Milad Mirbabaie, and S.T. Garnett. “Aware but Not Prepared: Understanding Situational Awareness during the Century Flood in Germany in 2021.” International Journal of Disaster Risk Reduction 96 (2023). https://doi.org/10.1016/j.ijdrr.2023.103936.
LibreCat | DOI
 

2023 | Journal Article | LibreCat-ID: 48063
Arias-Cabarcos, Patricia, Matin Fallahi, Thilo Habrich, Karen Schulze, Christian Becker, and Thorsten Strufe. “Performance and Usability Evaluation of Brainwave Authentication Techniques with Consumer Devices.” ACM Transactions on Privacy and Security 26, no. 3 (2023): 1–36. https://doi.org/10.1145/3579356.
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2023 | Journal Article | LibreCat-ID: 48058
Winkel, Fabian, Johannes Deuse-Kleinsteuber, and Joachim Böcker. “Run-to-Failure Relay Dataset for Predictive Maintenance Research With Machine Learning.” IEEE Transactions on Reliability, 2023, 1–14. https://doi.org/10.1109/tr.2023.3255786.
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2022 | Journal Article | LibreCat-ID: 31844
Fischer, Andreas, Benny Fuhry, Jörn Kußmaul, Jonas Janneck, Florian Kerschbaum, and Eric Bodden. “Computation on Encrypted Data Using Dataflow Authentication.” ACM Transactions on Privacy and Security 25, no. 3 (2022): 1–36. https://doi.org/10.1145/3513005.
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2015 | Conference Paper | LibreCat-ID: 10779
Guettatfi, Zakarya, Omar Kermia, and Abdelhakim Khouas. “Over Effective Hard Real-Time Hardware Tasks Scheduling and Allocation.” In 25th International Conference on Field Programmable Logic and Applications (FPL). Imperial College, 2015. https://doi.org/10.1109/FPL.2015.7293994.
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2014 | Journal Article | LibreCat-ID: 39483
Vidor, F.F., G.I. Wirth, and Ulrich Hilleringmann. “Low Temperature Fabrication of a ZnO Nanoparticle Thin-Film Transistor Suitable for Flexible Electronics.” Microelectronics Reliability 54, no. 12 (2014): 2760–65. https://doi.org/10.1016/j.microrel.2014.07.147.
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2006 | Conference Paper | LibreCat-ID: 38784
Krupp, Alexander, and Wolfgang Müller. “Classification Trees for Functional Coverage and Random Test Generation.” In Proceedings of the Design Automation & Test in Europe Conference. Munich, Germany: IEEE, 2006. https://doi.org/10.1109/DATE.2006.243902.
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