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7 Publications
2023 | Journal Article | LibreCat-ID: 46487
Zander, K. K., Nguyen, D., Mirbabaie, M., & Garnett, S. T. (2023). Aware but not prepared: understanding situational awareness during the century flood in Germany in 2021. International Journal of Disaster Risk Reduction, 96, Article 103936. https://doi.org/10.1016/j.ijdrr.2023.103936
LibreCat
| DOI
2023 | Journal Article | LibreCat-ID: 48063
Arias-Cabarcos, P., Fallahi, M., Habrich, T., Schulze, K., Becker, C., & Strufe, T. (2023). Performance and Usability Evaluation of Brainwave Authentication Techniques with Consumer Devices. ACM Transactions on Privacy and Security, 26(3), 1–36. https://doi.org/10.1145/3579356
LibreCat
| DOI
2023 | Journal Article | LibreCat-ID: 48058
Winkel, F., Deuse-Kleinsteuber, J., & Böcker, J. (2023). Run-to-Failure Relay Dataset for Predictive Maintenance Research With Machine Learning. IEEE Transactions on Reliability, 1–14. https://doi.org/10.1109/tr.2023.3255786
LibreCat
| DOI
2022 | Journal Article | LibreCat-ID: 31844
Fischer, A., Fuhry, B., Kußmaul, J., Janneck, J., Kerschbaum, F., & Bodden, E. (2022). Computation on Encrypted Data Using Dataflow Authentication. ACM Transactions on Privacy and Security, 25(3), 1–36. https://doi.org/10.1145/3513005
LibreCat
| DOI
2015 | Conference Paper | LibreCat-ID: 10779
Guettatfi, Z., Kermia, O., & Khouas, A. (2015). Over effective hard real-time hardware tasks scheduling and allocation. In 25th International Conference on Field Programmable Logic and Applications (FPL). Imperial College. https://doi.org/10.1109/FPL.2015.7293994
LibreCat
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2014 | Journal Article | LibreCat-ID: 39483
Vidor, F. F., Wirth, G. I., & Hilleringmann, U. (2014). Low temperature fabrication of a ZnO nanoparticle thin-film transistor suitable for flexible electronics. Microelectronics Reliability, 54(12), 2760–2765. https://doi.org/10.1016/j.microrel.2014.07.147
LibreCat
| DOI
2006 | Conference Paper | LibreCat-ID: 38784
Krupp, A., & Müller, W. (2006). Classification Trees for Functional Coverage and Random Test Generation. Proceedings of the Design Automation & Test in Europe Conference. https://doi.org/10.1109/DATE.2006.243902
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