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7 Publications
2023 | Journal Article | LibreCat-ID: 46487
Zander, K. K., et al. “Aware but Not Prepared: Understanding Situational Awareness during the Century Flood in Germany in 2021.” International Journal of Disaster Risk Reduction, vol. 96, 103936, Elsevier BV, 2023, doi:10.1016/j.ijdrr.2023.103936.
LibreCat
| DOI
2023 | Journal Article | LibreCat-ID: 48063
Arias-Cabarcos, Patricia, et al. “Performance and Usability Evaluation of Brainwave Authentication Techniques with Consumer Devices.” ACM Transactions on Privacy and Security, vol. 26, no. 3, Association for Computing Machinery (ACM), 2023, pp. 1–36, doi:10.1145/3579356.
LibreCat
| DOI
2023 | Journal Article | LibreCat-ID: 48058
Winkel, Fabian, et al. “Run-to-Failure Relay Dataset for Predictive Maintenance Research With Machine Learning.” IEEE Transactions on Reliability, Institute of Electrical and Electronics Engineers (IEEE), 2023, pp. 1–14, doi:10.1109/tr.2023.3255786.
LibreCat
| DOI
2022 | Journal Article | LibreCat-ID: 31844
Fischer, Andreas, et al. “Computation on Encrypted Data Using Dataflow Authentication.” ACM Transactions on Privacy and Security, vol. 25, no. 3, Association for Computing Machinery (ACM), 2022, pp. 1–36, doi:10.1145/3513005.
LibreCat
| DOI
2015 | Conference Paper | LibreCat-ID: 10779
Guettatfi, Zakarya, et al. “Over Effective Hard Real-Time Hardware Tasks Scheduling and Allocation.” 25th International Conference on Field Programmable Logic and Applications (FPL), Imperial College, 2015, doi:10.1109/FPL.2015.7293994.
LibreCat
| DOI
2014 | Journal Article | LibreCat-ID: 39483
Vidor, F. F., et al. “Low Temperature Fabrication of a ZnO Nanoparticle Thin-Film Transistor Suitable for Flexible Electronics.” Microelectronics Reliability, vol. 54, no. 12, Elsevier BV, 2014, pp. 2760–65, doi:10.1016/j.microrel.2014.07.147.
LibreCat
| DOI
2006 | Conference Paper | LibreCat-ID: 38784
Krupp, Alexander, and Wolfgang Müller. “Classification Trees for Functional Coverage and Random Test Generation.” Proceedings of the Design Automation & Test in Europe Conference, IEEE, 2006, doi:10.1109/DATE.2006.243902.
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