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2 Publications
2022 | Conference Paper | LibreCat-ID: 34140
Maalouly J, Hemker D, Hedayat C, et al. AI Assisted Interference Classification to Improve EMC Troubleshooting in Electronic System Development. In: 2022 Kleinheubach Conference. IEEE; 2022.
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2020 | Book Chapter | LibreCat-ID: 21542
Schröder D, Lange S, Hangmann C, Hedayat C. Far-field prediction combining simulations with near-field measurements for EMI assessment of PCBs. In: Tensorial Analysis of Networks (TAN) Modelling for PCB Signal Integrity and EMC Analysis. 1st ed. Croyton, UK: The Institution of Engineering and Technology (IET); 2020:315-346 (32). doi:10.1049/pbcs072e_ch14
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