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2 Publications
2022 | Conference Paper | LibreCat-ID: 34140
J. Maalouly et al., “AI Assisted Interference Classification to Improve EMC Troubleshooting in Electronic System Development,” presented at the 2022 Kleinheubach Conference, Miltenberg, Germany, 2022.
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2020 | Book Chapter | LibreCat-ID: 21542
D. Schröder, S. Lange, C. Hangmann, and C. Hedayat, “Far-field prediction combining simulations with near-field measurements for EMI assessment of PCBs,” in Tensorial Analysis of Networks (TAN) Modelling for PCB Signal Integrity and EMC Analysis, 1st ed., Croyton, UK: The Institution of Engineering and Technology (IET), 2020, pp. 315-346 (32).
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