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1364 Publications
2011 | Misc | LibreCat-ID: 42854
Kraft, K. (2011). ‚Glamour und Grauen. Das Erforschen und Ausstellen von Bekleidung aus den 1930er und 1940er Jahren’. in: …textil… 1/2011, S. 1-9.
LibreCat
2011 | Misc | LibreCat-ID: 42856
Kraft, K. (2011). Cutting Patterns. in: Lois Weinthal (ed.): Toward a New Interior. An Anthology of Interior Design Theory, New York 2011.
LibreCat
2011 | Journal Article | LibreCat-ID: 25965
Chernikov, A., Horst, S., Waitz, T., Tiemann, M., & Chatterjee, S. (2011). Photoluminescence Properties of Ordered Mesoporous ZnO. The Journal of Physical Chemistry C, 1375–1379. https://doi.org/10.1021/jp104293e
LibreCat
| DOI
2011 | Report | LibreCat-ID: 42970
Sevignani, S., Kreilinger, V., Allmer, T., & Fuchs, C. (2011). Analysis of Existing Empirical Research Methods for Studying (Online) Privacy and Surveillance.
LibreCat
2011 | Report | LibreCat-ID: 42969
Allmer, T. (2011). Towards a Critical Theory of Surveillance Studies.
LibreCat
2011 | Journal Article | LibreCat-ID: 43008
Allmer, T. (2011). Critical Surveillance Studies in the Information Society. TripleC , 9(2), 566–592. https://doi.org/10.31269/triplec.v9i2.266
LibreCat
| DOI
2011 | Book (Editor) | LibreCat-ID: 42946
Sandoval , M., Sevignani, S., Rehbogen, A., Allmer, T., Hager, M., & Kreilinger, V. (Eds.). (2011). Bildung MACHT Gesellschaft. Westfälisches Dampfboot.
LibreCat
2011 | Journal Article | LibreCat-ID: 39533
Vidor, F. F., Wirth, G. I., Wolff, K., & Hilleringmann, U. (2011). Study on the Performance Enhancement of ZnO Nanoparticles Thin-Film Transistors. ECS Transactions, 39(1), 109–115. https://doi.org/10.1149/1.3615183
LibreCat
| DOI
2011 | Journal Article | LibreCat-ID: 39527
Wolff, K., & Hilleringmann, U. (2011). Solution processed inverter based on zinc oxide nanoparticle thin-film transistors with poly(4-vinylphenol) gate dielectric. Solid-State Electronics, 62(1), 110–114. https://doi.org/10.1016/j.sse.2011.01.046
LibreCat
| DOI
2011 | Conference Paper | LibreCat-ID: 39536
Frers, T., Hett, T., Hilleringmann, U., Berth, G., Widhalm, A., & Zrenner, A. (2011). Characterization of SiON integrated waveguides via FTIR and AFM measurements. 2011 Semiconductor Conference Dresden. https://doi.org/10.1109/scd.2011.6068744
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| DOI