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1355 Publications
2011 | Misc | LibreCat-ID: 42854
Kraft, Kerstin. ‚Glamour und Grauen. Das Erforschen und Ausstellen von Bekleidung aus den 1930er und 1940er Jahren’. in: …textil… 1/2011, S. 1-9, 2011.
LibreCat
2011 | Misc | LibreCat-ID: 42856
Kraft, Kerstin. Cutting Patterns. in: Lois Weinthal (ed.): Toward a New Interior. An Anthology of Interior Design Theory, New York 2011, 2011.
LibreCat
2011 | Journal Article | LibreCat-ID: 25965
Chernikov, Alexej, Swantje Horst, Thomas Waitz, Michael Tiemann, and Sangam Chatterjee. “Photoluminescence Properties of Ordered Mesoporous ZnO.” The Journal of Physical Chemistry C, 2011, 1375–79. https://doi.org/10.1021/jp104293e.
LibreCat
| DOI
2011 | Report | LibreCat-ID: 42970
Sevignani, Sebastian, Verena Kreilinger, Thomas Allmer, and Christian Fuchs. Analysis of Existing Empirical Research Methods for Studying (Online) Privacy and Surveillance, 2011.
LibreCat
2011 | Report | LibreCat-ID: 42969
Allmer, Thomas. Towards a Critical Theory of Surveillance Studies. Vienna, 2011.
LibreCat
2011 | Journal Article | LibreCat-ID: 43008
Allmer, Thomas. “Critical Surveillance Studies in the Information Society.” TripleC 9, no. 2 (2011): 566–92. https://doi.org/10.31269/triplec.v9i2.266.
LibreCat
| DOI
2011 | Book (Editor) | LibreCat-ID: 42946
Sandoval , Marisol, Sebastian Sevignani, Alexander Rehbogen, Thomas Allmer, Matthias Hager, and Verena Kreilinger, eds. Bildung MACHT Gesellschaft. Münster: Westfälisches Dampfboot., 2011.
LibreCat
2011 | Journal Article | LibreCat-ID: 39533
Vidor, Fábio Fedrizzi, Gilson Inácio Wirth, Karsten Wolff, and Ulrich Hilleringmann. “Study on the Performance Enhancement of ZnO Nanoparticles Thin-Film Transistors.” ECS Transactions 39, no. 1 (2011): 109–15. https://doi.org/10.1149/1.3615183.
LibreCat
| DOI
2011 | Journal Article | LibreCat-ID: 39527
Wolff, K., and Ulrich Hilleringmann. “Solution Processed Inverter Based on Zinc Oxide Nanoparticle Thin-Film Transistors with Poly(4-Vinylphenol) Gate Dielectric.” Solid-State Electronics 62, no. 1 (2011): 110–14. https://doi.org/10.1016/j.sse.2011.01.046.
LibreCat
| DOI
2011 | Conference Paper | LibreCat-ID: 39536
Frers, Torsten, Thomas Hett, Ulrich Hilleringmann, Gerhard Berth, Alex Widhalm, and Artur Zrenner. “Characterization of SiON Integrated Waveguides via FTIR and AFM Measurements.” In 2011 Semiconductor Conference Dresden. IEEE, 2011. https://doi.org/10.1109/scd.2011.6068744.
LibreCat
| DOI