9 Publications
2025 | Conference Paper | LibreCat-ID: 59218
@inproceedings{Reimer_Holst_Sadeghi-Kohan_Wunderlich_Hellebrand_2025, place={Hong Kong, China}, title={ThorSim: Throughput-Oriented Timing Simulation of FinFET Digital Circuits}, booktitle={To appear: IEEE International Symposium of Electronics Design Automation (ISEDA’25), May 2025}, author={Reimer, Jan Dennis and Holst, Stefan and Sadeghi-Kohan, Somayeh and Wunderlich, Hans-Joachim and Hellebrand, Sybille}, year={2025} }
LibreCat
2024 | Misc | LibreCat-ID: 50284
@book{Stiballe_Reimer_Sadeghi-Kohan_Hellebrand_2024, place={Darmstadt, Germany}, title={Modeling Crosstalk-induced Interconnect Delay with Polynomial Regression}, publisher={37. ITG / GMM / GI -Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen” (TuZ’24), Feb. 2024}, author={Stiballe, Alisa and Reimer, Jan Dennis and Sadeghi-Kohan, Somayeh and Hellebrand, Sybille}, year={2024} }
LibreCat
2024 | Conference Paper | LibreCat-ID: 56014
@inproceedings{Jafarzadeh_Klemme_Reimer_ Amrouch_Hellebrand_Wunderlich_2024, place={San Diego, CA}, title={Minimizing PVT-Variability by Exploiting the Zero Temperature Coefficient (ZTC) for Robust Delay Fault Testing}, booktitle={In: IEEE International Test Conference (ITC’24), San Diego, CA, USA, November 2024}, publisher={IEEE}, author={Jafarzadeh, Hanieh and Klemme, Florian and Reimer, Jan Dennis and Amrouch, Hussam and Hellebrand, Sybille and Wunderlich, Hans-Joachim}, year={2024} }
LibreCat
2023 | Conference Paper | LibreCat-ID: 46738
@inproceedings{Sadeghi-Kohan_Reimer_Hellebrand_Wunderlich_2023, place={Beijing, China}, title={Optimizing the Streaming of Sensor Data with Approximate Communication}, booktitle={IEEE Asian Test Symposium (ATS’23), October 2023}, author={Sadeghi-Kohan, Somayeh and Reimer, Jan Dennis and Hellebrand, Sybille and Wunderlich, Hans-Joachim}, year={2023} }
LibreCat
2023 | Conference Paper | LibreCat-ID: 45830
@inproceedings{Jafarzadeh_Klemme_Reimer_Najafi Haghi_ Amrouch_Hellebrand_ Wunderlich_2023, place={Anaheim, CA, USA}, title={Robust Pattern Generation for Small Delay Faults under Process Variations}, booktitle={IEEE International Test Conference (ITC’23), Anaheim, USA, October 2023}, publisher={IEEE}, author={Jafarzadeh, Hanieh and Klemme, Florian and Reimer, Jan Dennis and Najafi Haghi, Zahra Paria and Amrouch, Hussam and Hellebrand, Sybille and Wunderlich, Hans-Joachim}, year={2023} }
LibreCat
2023 | Misc | LibreCat-ID: 35204
@book{Ghazal_Sadeghi-Kohan_Reimer_Hellebrand_2023, place={Erfurt, Germany}, title={On Cryptography Effects on Interconnect Reliability}, publisher={35. Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen” (TuZ’23), Feb. 2023}, author={Ghazal, Abdulkarim and Sadeghi-Kohan, Somayeh and Reimer, Jan Dennis and Hellebrand, Sybille}, year={2023} }
LibreCat
2023 | Conference Paper | LibreCat-ID: 41875
@inproceedings{Badran_Sadeghi-Kohan_Reimer_Hellebrand_2023, place={Venice, Italy}, title={Approximate Computing: Balancing Performance, Power, Reliability, and Safety}, booktitle={28th IEEE European Test Symposium (ETS’23), May 2023}, author={Badran, Abdalrhman and Sadeghi-Kohan, Somayeh and Reimer, Jan Dennis and Hellebrand, Sybille}, year={2023} }
LibreCat
2020 | Conference Paper | LibreCat-ID: 19422
@inproceedings{Sprenger_Sadeghi-Kohan_Reimer_Hellebrand_2020, place={Virtual Conference - Originally Frascati (Rome), Italy}, title={Variation-Aware Test for Logic Interconnects using Neural Networks - A Case Study}, booktitle={IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT’20), October 2020}, author={Sprenger, Alexander and Sadeghi-Kohan, Somayeh and Reimer, Jan Dennis and Hellebrand, Sybille}, year={2020} }
LibreCat
2020 | Conference Paper | LibreCat-ID: 19421
@inproceedings{Holst_Kampmann_Sprenger_Reimer_Hellebrand_Wunderlich_Weng_2020, place={Virtual Conference - Originally Washington, DC, USA}, title={Logic Fault Diagnosis of Hidden Delay Defects}, booktitle={IEEE International Test Conference (ITC’20), November 2020}, author={Holst, Stefan and Kampmann, Matthias and Sprenger, Alexander and Reimer, Jan Dennis and Hellebrand, Sybille and Wunderlich, Hans-Joachim and Weng, Xiaoqing}, year={2020} }
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9 Publications
2025 | Conference Paper | LibreCat-ID: 59218
@inproceedings{Reimer_Holst_Sadeghi-Kohan_Wunderlich_Hellebrand_2025, place={Hong Kong, China}, title={ThorSim: Throughput-Oriented Timing Simulation of FinFET Digital Circuits}, booktitle={To appear: IEEE International Symposium of Electronics Design Automation (ISEDA’25), May 2025}, author={Reimer, Jan Dennis and Holst, Stefan and Sadeghi-Kohan, Somayeh and Wunderlich, Hans-Joachim and Hellebrand, Sybille}, year={2025} }
LibreCat
2024 | Misc | LibreCat-ID: 50284
@book{Stiballe_Reimer_Sadeghi-Kohan_Hellebrand_2024, place={Darmstadt, Germany}, title={Modeling Crosstalk-induced Interconnect Delay with Polynomial Regression}, publisher={37. ITG / GMM / GI -Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen” (TuZ’24), Feb. 2024}, author={Stiballe, Alisa and Reimer, Jan Dennis and Sadeghi-Kohan, Somayeh and Hellebrand, Sybille}, year={2024} }
LibreCat
2024 | Conference Paper | LibreCat-ID: 56014
@inproceedings{Jafarzadeh_Klemme_Reimer_ Amrouch_Hellebrand_Wunderlich_2024, place={San Diego, CA}, title={Minimizing PVT-Variability by Exploiting the Zero Temperature Coefficient (ZTC) for Robust Delay Fault Testing}, booktitle={In: IEEE International Test Conference (ITC’24), San Diego, CA, USA, November 2024}, publisher={IEEE}, author={Jafarzadeh, Hanieh and Klemme, Florian and Reimer, Jan Dennis and Amrouch, Hussam and Hellebrand, Sybille and Wunderlich, Hans-Joachim}, year={2024} }
LibreCat
2023 | Conference Paper | LibreCat-ID: 46738
@inproceedings{Sadeghi-Kohan_Reimer_Hellebrand_Wunderlich_2023, place={Beijing, China}, title={Optimizing the Streaming of Sensor Data with Approximate Communication}, booktitle={IEEE Asian Test Symposium (ATS’23), October 2023}, author={Sadeghi-Kohan, Somayeh and Reimer, Jan Dennis and Hellebrand, Sybille and Wunderlich, Hans-Joachim}, year={2023} }
LibreCat
2023 | Conference Paper | LibreCat-ID: 45830
@inproceedings{Jafarzadeh_Klemme_Reimer_Najafi Haghi_ Amrouch_Hellebrand_ Wunderlich_2023, place={Anaheim, CA, USA}, title={Robust Pattern Generation for Small Delay Faults under Process Variations}, booktitle={IEEE International Test Conference (ITC’23), Anaheim, USA, October 2023}, publisher={IEEE}, author={Jafarzadeh, Hanieh and Klemme, Florian and Reimer, Jan Dennis and Najafi Haghi, Zahra Paria and Amrouch, Hussam and Hellebrand, Sybille and Wunderlich, Hans-Joachim}, year={2023} }
LibreCat
2023 | Misc | LibreCat-ID: 35204
@book{Ghazal_Sadeghi-Kohan_Reimer_Hellebrand_2023, place={Erfurt, Germany}, title={On Cryptography Effects on Interconnect Reliability}, publisher={35. Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen” (TuZ’23), Feb. 2023}, author={Ghazal, Abdulkarim and Sadeghi-Kohan, Somayeh and Reimer, Jan Dennis and Hellebrand, Sybille}, year={2023} }
LibreCat
2023 | Conference Paper | LibreCat-ID: 41875
@inproceedings{Badran_Sadeghi-Kohan_Reimer_Hellebrand_2023, place={Venice, Italy}, title={Approximate Computing: Balancing Performance, Power, Reliability, and Safety}, booktitle={28th IEEE European Test Symposium (ETS’23), May 2023}, author={Badran, Abdalrhman and Sadeghi-Kohan, Somayeh and Reimer, Jan Dennis and Hellebrand, Sybille}, year={2023} }
LibreCat
2020 | Conference Paper | LibreCat-ID: 19422
@inproceedings{Sprenger_Sadeghi-Kohan_Reimer_Hellebrand_2020, place={Virtual Conference - Originally Frascati (Rome), Italy}, title={Variation-Aware Test for Logic Interconnects using Neural Networks - A Case Study}, booktitle={IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT’20), October 2020}, author={Sprenger, Alexander and Sadeghi-Kohan, Somayeh and Reimer, Jan Dennis and Hellebrand, Sybille}, year={2020} }
LibreCat
2020 | Conference Paper | LibreCat-ID: 19421
@inproceedings{Holst_Kampmann_Sprenger_Reimer_Hellebrand_Wunderlich_Weng_2020, place={Virtual Conference - Originally Washington, DC, USA}, title={Logic Fault Diagnosis of Hidden Delay Defects}, booktitle={IEEE International Test Conference (ITC’20), November 2020}, author={Holst, Stefan and Kampmann, Matthias and Sprenger, Alexander and Reimer, Jan Dennis and Hellebrand, Sybille and Wunderlich, Hans-Joachim and Weng, Xiaoqing}, year={2020} }
LibreCat