4 Publications
2023 | Conference Paper | LibreCat-ID: 41875
Approximate Computing: Balancing Performance, Power, Reliability, and Safety
A. Badran, S. Sadeghi-Kohan, J.D. Reimer, S. Hellebrand, in: To Appear: 28th IEEE European Test Symposium (ETS’23), May 2023, Venice, Italy, 2023.
LibreCat
A. Badran, S. Sadeghi-Kohan, J.D. Reimer, S. Hellebrand, in: To Appear: 28th IEEE European Test Symposium (ETS’23), May 2023, Venice, Italy, 2023.
2023 | Misc | LibreCat-ID: 35204
On Cryptography Effects on Interconnect Reliability
A. Ghazal, S. Sadeghi-Kohan, J.D. Reimer, S. Hellebrand, On Cryptography Effects on Interconnect Reliability, 35. Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen” (TuZ’23), Feb. 2023, Erfurt, Germany, 2023.
LibreCat
A. Ghazal, S. Sadeghi-Kohan, J.D. Reimer, S. Hellebrand, On Cryptography Effects on Interconnect Reliability, 35. Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen” (TuZ’23), Feb. 2023, Erfurt, Germany, 2023.
2020 | Conference Paper | LibreCat-ID: 19422
Variation-Aware Test for Logic Interconnects using Neural Networks - A Case Study
A. Sprenger, S. Sadeghi-Kohan, J.D. Reimer, S. Hellebrand, in: IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT’20), October 2020, Virtual Conference - Originally Frascati (Rome), Italy, 2020.
LibreCat
A. Sprenger, S. Sadeghi-Kohan, J.D. Reimer, S. Hellebrand, in: IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT’20), October 2020, Virtual Conference - Originally Frascati (Rome), Italy, 2020.
2020 | Conference Paper | LibreCat-ID: 19421
Logic Fault Diagnosis of Hidden Delay Defects
S. Holst, M. Kampmann, A. Sprenger, J.D. Reimer, S. Hellebrand, H.-J. Wunderlich, X. Weng, in: IEEE International Test Conference (ITC’20), November 2020, Virtual Conference - Originally Washington, DC, USA, 2020.
LibreCat
S. Holst, M. Kampmann, A. Sprenger, J.D. Reimer, S. Hellebrand, H.-J. Wunderlich, X. Weng, in: IEEE International Test Conference (ITC’20), November 2020, Virtual Conference - Originally Washington, DC, USA, 2020.
4 Publications
2023 | Conference Paper | LibreCat-ID: 41875
Approximate Computing: Balancing Performance, Power, Reliability, and Safety
A. Badran, S. Sadeghi-Kohan, J.D. Reimer, S. Hellebrand, in: To Appear: 28th IEEE European Test Symposium (ETS’23), May 2023, Venice, Italy, 2023.
LibreCat
A. Badran, S. Sadeghi-Kohan, J.D. Reimer, S. Hellebrand, in: To Appear: 28th IEEE European Test Symposium (ETS’23), May 2023, Venice, Italy, 2023.
2023 | Misc | LibreCat-ID: 35204
On Cryptography Effects on Interconnect Reliability
A. Ghazal, S. Sadeghi-Kohan, J.D. Reimer, S. Hellebrand, On Cryptography Effects on Interconnect Reliability, 35. Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen” (TuZ’23), Feb. 2023, Erfurt, Germany, 2023.
LibreCat
A. Ghazal, S. Sadeghi-Kohan, J.D. Reimer, S. Hellebrand, On Cryptography Effects on Interconnect Reliability, 35. Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen” (TuZ’23), Feb. 2023, Erfurt, Germany, 2023.
2020 | Conference Paper | LibreCat-ID: 19422
Variation-Aware Test for Logic Interconnects using Neural Networks - A Case Study
A. Sprenger, S. Sadeghi-Kohan, J.D. Reimer, S. Hellebrand, in: IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT’20), October 2020, Virtual Conference - Originally Frascati (Rome), Italy, 2020.
LibreCat
A. Sprenger, S. Sadeghi-Kohan, J.D. Reimer, S. Hellebrand, in: IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT’20), October 2020, Virtual Conference - Originally Frascati (Rome), Italy, 2020.
2020 | Conference Paper | LibreCat-ID: 19421
Logic Fault Diagnosis of Hidden Delay Defects
S. Holst, M. Kampmann, A. Sprenger, J.D. Reimer, S. Hellebrand, H.-J. Wunderlich, X. Weng, in: IEEE International Test Conference (ITC’20), November 2020, Virtual Conference - Originally Washington, DC, USA, 2020.
LibreCat
S. Holst, M. Kampmann, A. Sprenger, J.D. Reimer, S. Hellebrand, H.-J. Wunderlich, X. Weng, in: IEEE International Test Conference (ITC’20), November 2020, Virtual Conference - Originally Washington, DC, USA, 2020.