Low Power Embedded DRAMs with High Quality Error Correcting Capabilities

P. Oehler, S. Hellebrand, in: {10th IEEE European Test Symposium (ETS’05)}, {IEEE}, Tallinn, Estonia, 2005, pp. 148–153.

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{10th IEEE European Test Symposium (ETS'05)}
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148-153
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Oehler P, Hellebrand S. Low Power Embedded DRAMs with High Quality Error Correcting Capabilities. In: {10th IEEE European Test Symposium (ETS’05)}. Tallinn, Estonia: {IEEE}; 2005:148-153. doi:10.1109/ets.2005.28
Oehler, P., & Hellebrand, S. (2005). Low Power Embedded DRAMs with High Quality Error Correcting Capabilities. In {10th IEEE European Test Symposium (ETS’05)} (pp. 148–153). Tallinn, Estonia: {IEEE}. https://doi.org/10.1109/ets.2005.28
@inproceedings{Oehler_Hellebrand_2005, place={Tallinn, Estonia}, title={Low Power Embedded DRAMs with High Quality Error Correcting Capabilities}, DOI={10.1109/ets.2005.28}, booktitle={{10th IEEE European Test Symposium (ETS’05)}}, publisher={{IEEE}}, author={Oehler, Philipp and Hellebrand, Sybille}, year={2005}, pages={148–153} }
Oehler, Philipp, and Sybille Hellebrand. “Low Power Embedded DRAMs with High Quality Error Correcting Capabilities.” In {10th IEEE European Test Symposium (ETS’05)}, 148–53. Tallinn, Estonia: {IEEE}, 2005. https://doi.org/10.1109/ets.2005.28.
P. Oehler and S. Hellebrand, “Low Power Embedded DRAMs with High Quality Error Correcting Capabilities,” in {10th IEEE European Test Symposium (ETS’05)}, 2005, pp. 148–153.
Oehler, Philipp, and Sybille Hellebrand. “Low Power Embedded DRAMs with High Quality Error Correcting Capabilities.” {10th IEEE European Test Symposium (ETS’05)}, {IEEE}, 2005, pp. 148–53, doi:10.1109/ets.2005.28.

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