Low Power Embedded DRAMs with High Quality Error Correcting Capabilities
P. Oehler, S. Hellebrand, in: 10th IEEE European Test Symposium (ETS’05), IEEE, Tallinn, Estonia, 2005, pp. 148–153.
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Oehler, Philipp;
Hellebrand, SybilleLibreCat 
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10th IEEE European Test Symposium (ETS'05)
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148-153
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Oehler P, Hellebrand S. Low Power Embedded DRAMs with High Quality Error Correcting Capabilities. In: 10th IEEE European Test Symposium (ETS’05). IEEE; 2005:148-153. doi:10.1109/ets.2005.28
Oehler, P., & Hellebrand, S. (2005). Low Power Embedded DRAMs with High Quality Error Correcting Capabilities. 10th IEEE European Test Symposium (ETS’05), 148–153. https://doi.org/10.1109/ets.2005.28
@inproceedings{Oehler_Hellebrand_2005, place={Tallinn, Estonia}, title={Low Power Embedded DRAMs with High Quality Error Correcting Capabilities}, DOI={10.1109/ets.2005.28}, booktitle={10th IEEE European Test Symposium (ETS’05)}, publisher={IEEE}, author={Oehler, Philipp and Hellebrand, Sybille}, year={2005}, pages={148–153} }
Oehler, Philipp, and Sybille Hellebrand. “Low Power Embedded DRAMs with High Quality Error Correcting Capabilities.” In 10th IEEE European Test Symposium (ETS’05), 148–53. Tallinn, Estonia: IEEE, 2005. https://doi.org/10.1109/ets.2005.28.
P. Oehler and S. Hellebrand, “Low Power Embedded DRAMs with High Quality Error Correcting Capabilities,” in 10th IEEE European Test Symposium (ETS’05), 2005, pp. 148–153, doi: 10.1109/ets.2005.28.
Oehler, Philipp, and Sybille Hellebrand. “Low Power Embedded DRAMs with High Quality Error Correcting Capabilities.” 10th IEEE European Test Symposium (ETS’05), IEEE, 2005, pp. 148–53, doi:10.1109/ets.2005.28.
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