Error Detecting Refreshment for Embedded DRAMs
S. Hellebrand, H.-J. Wunderlich, A. A. Ivaniuk, Y. V. Klimets, V. N. Yarmolik, in: 17th IEEE VLSI Test Symposium (VTS’99), IEEE, Dana Point, CA, USA, 1999, pp. 384–390.
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Hellebrand, SybilleLibreCat 
;
Wunderlich, Hans-Joachim;
A. Ivaniuk, Alexander;
V. Klimets, Yuri;
N. Yarmolik, Vyacheslav
;
Wunderlich, Hans-Joachim;
A. Ivaniuk, Alexander;
V. Klimets, Yuri;
N. Yarmolik, VyacheslavDepartment
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Proceedings Title
17th IEEE VLSI Test Symposium (VTS'99)
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384-390
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Hellebrand S, Wunderlich H-J, A. Ivaniuk A, V. Klimets Y, N. Yarmolik V. Error Detecting Refreshment for Embedded DRAMs. In: 17th IEEE VLSI Test Symposium (VTS’99). IEEE; 1999:384-390. doi:10.1109/vtest.1999.766693
Hellebrand, S., Wunderlich, H.-J., A. Ivaniuk, A., V. Klimets, Y., & N. Yarmolik, V. (1999). Error Detecting Refreshment for Embedded DRAMs. 17th IEEE VLSI Test Symposium (VTS’99), 384–390. https://doi.org/10.1109/vtest.1999.766693
@inproceedings{Hellebrand_Wunderlich_A. Ivaniuk_V. Klimets_N. Yarmolik_1999, place={Dana Point, CA, USA}, title={Error Detecting Refreshment for Embedded DRAMs}, DOI={10.1109/vtest.1999.766693}, booktitle={17th IEEE VLSI Test Symposium (VTS’99)}, publisher={IEEE}, author={Hellebrand, Sybille and Wunderlich, Hans-Joachim and A. Ivaniuk, Alexander and V. Klimets, Yuri and N. Yarmolik, Vyacheslav}, year={1999}, pages={384–390} }
Hellebrand, Sybille, Hans-Joachim Wunderlich, Alexander A. Ivaniuk, Yuri V. Klimets, and Vyacheslav N. Yarmolik. “Error Detecting Refreshment for Embedded DRAMs.” In 17th IEEE VLSI Test Symposium (VTS’99), 384–90. Dana Point, CA, USA: IEEE, 1999. https://doi.org/10.1109/vtest.1999.766693.
S. Hellebrand, H.-J. Wunderlich, A. A. Ivaniuk, Y. V. Klimets, and V. N. Yarmolik, “Error Detecting Refreshment for Embedded DRAMs,” in 17th IEEE VLSI Test Symposium (VTS’99), 1999, pp. 384–390, doi: 10.1109/vtest.1999.766693.
Hellebrand, Sybille, et al. “Error Detecting Refreshment for Embedded DRAMs.” 17th IEEE VLSI Test Symposium (VTS’99), IEEE, 1999, pp. 384–90, doi:10.1109/vtest.1999.766693.
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