X Marks the Spot: Scan-Flip-Flop Clustering for Faster-than-at-Speed Test

M. Kampmann, S. Hellebrand, in: {25th IEEE Asian Test Symposium (ATS’16)}, {IEEE}, Hiroshima, Japan, 2016, pp. 1–6.

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Conference Paper | English
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{25th IEEE Asian Test Symposium (ATS'16)}
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1-6
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Kampmann M, Hellebrand S. X Marks the Spot: Scan-Flip-Flop Clustering for Faster-than-at-Speed Test. In: {25th IEEE Asian Test Symposium (ATS’16)}. Hiroshima, Japan: {IEEE}; 2016:1-6. doi:10.1109/ats.2016.20
Kampmann, M., & Hellebrand, S. (2016). X Marks the Spot: Scan-Flip-Flop Clustering for Faster-than-at-Speed Test. In {25th IEEE Asian Test Symposium (ATS’16)} (pp. 1–6). Hiroshima, Japan: {IEEE}. https://doi.org/10.1109/ats.2016.20
@inproceedings{Kampmann_Hellebrand_2016, place={Hiroshima, Japan}, title={X Marks the Spot: Scan-Flip-Flop Clustering for Faster-than-at-Speed Test}, DOI={10.1109/ats.2016.20}, booktitle={{25th IEEE Asian Test Symposium (ATS’16)}}, publisher={{IEEE}}, author={Kampmann, Matthias and Hellebrand, Sybille}, year={2016}, pages={1–6} }
Kampmann, Matthias, and Sybille Hellebrand. “X Marks the Spot: Scan-Flip-Flop Clustering for Faster-than-at-Speed Test.” In {25th IEEE Asian Test Symposium (ATS’16)}, 1–6. Hiroshima, Japan: {IEEE}, 2016. https://doi.org/10.1109/ats.2016.20.
M. Kampmann and S. Hellebrand, “X Marks the Spot: Scan-Flip-Flop Clustering for Faster-than-at-Speed Test,” in {25th IEEE Asian Test Symposium (ATS’16)}, 2016, pp. 1–6.
Kampmann, Matthias, and Sybille Hellebrand. “X Marks the Spot: Scan-Flip-Flop Clustering for Faster-than-at-Speed Test.” {25th IEEE Asian Test Symposium (ATS’16)}, {IEEE}, 2016, pp. 1–6, doi:10.1109/ats.2016.20.

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