Diagnostic Test of Robust Circuits

A. Cook, S. Hellebrand, T. Indlekofer, H.-J. Wunderlich, in: {20th IEEE Asian Test Symposium (ATS’11)}, {IEEE}, New Delhi, India, 2011, pp. 285–290.

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Conference Paper | English
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{20th IEEE Asian Test Symposium (ATS'11)}
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285-290
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Cook A, Hellebrand S, Indlekofer T, Wunderlich H-J. Diagnostic Test of Robust Circuits. In: {20th IEEE Asian Test Symposium (ATS’11)}. New Delhi, India: {IEEE}; 2011:285-290. doi:10.1109/ats.2011.55
Cook, A., Hellebrand, S., Indlekofer, T., & Wunderlich, H.-J. (2011). Diagnostic Test of Robust Circuits. In {20th IEEE Asian Test Symposium (ATS’11)} (pp. 285–290). New Delhi, India: {IEEE}. https://doi.org/10.1109/ats.2011.55
@inproceedings{Cook_Hellebrand_Indlekofer_Wunderlich_2011, place={New Delhi, India}, title={Diagnostic Test of Robust Circuits}, DOI={10.1109/ats.2011.55}, booktitle={{20th IEEE Asian Test Symposium (ATS’11)}}, publisher={{IEEE}}, author={Cook, Alejandro and Hellebrand, Sybille and Indlekofer, Thomas and Wunderlich, Hans-Joachim}, year={2011}, pages={285–290} }
Cook, Alejandro, Sybille Hellebrand, Thomas Indlekofer, and Hans-Joachim Wunderlich. “Diagnostic Test of Robust Circuits.” In {20th IEEE Asian Test Symposium (ATS’11)}, 285–90. New Delhi, India: {IEEE}, 2011. https://doi.org/10.1109/ats.2011.55.
A. Cook, S. Hellebrand, T. Indlekofer, and H.-J. Wunderlich, “Diagnostic Test of Robust Circuits,” in {20th IEEE Asian Test Symposium (ATS’11)}, 2011, pp. 285–290.
Cook, Alejandro, et al. “Diagnostic Test of Robust Circuits.” {20th IEEE Asian Test Symposium (ATS’11)}, {IEEE}, 2011, pp. 285–90, doi:10.1109/ats.2011.55.

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