Diagnostic Test of Robust Circuits

A. Cook, S. Hellebrand, T. Indlekofer, H.-J. Wunderlich, in: 20th IEEE Asian Test Symposium (ATS’11), IEEE, New Delhi, India, 2011, pp. 285–290.

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Conference Paper | English
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20th IEEE Asian Test Symposium (ATS'11)
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285-290
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Cook A, Hellebrand S, Indlekofer T, Wunderlich H-J. Diagnostic Test of Robust Circuits. In: 20th IEEE Asian Test Symposium (ATS’11). New Delhi, India: IEEE; 2011:285-290. doi:10.1109/ats.2011.55
Cook, A., Hellebrand, S., Indlekofer, T., & Wunderlich, H.-J. (2011). Diagnostic Test of Robust Circuits. In 20th IEEE Asian Test Symposium (ATS’11) (pp. 285–290). New Delhi, India: IEEE. https://doi.org/10.1109/ats.2011.55
@inproceedings{Cook_Hellebrand_Indlekofer_Wunderlich_2011, place={New Delhi, India}, title={Diagnostic Test of Robust Circuits}, DOI={10.1109/ats.2011.55}, booktitle={20th IEEE Asian Test Symposium (ATS’11)}, publisher={IEEE}, author={Cook, Alejandro and Hellebrand, Sybille and Indlekofer, Thomas and Wunderlich, Hans-Joachim}, year={2011}, pages={285–290} }
Cook, Alejandro, Sybille Hellebrand, Thomas Indlekofer, and Hans-Joachim Wunderlich. “Diagnostic Test of Robust Circuits.” In 20th IEEE Asian Test Symposium (ATS’11), 285–90. New Delhi, India: IEEE, 2011. https://doi.org/10.1109/ats.2011.55.
A. Cook, S. Hellebrand, T. Indlekofer, and H.-J. Wunderlich, “Diagnostic Test of Robust Circuits,” in 20th IEEE Asian Test Symposium (ATS’11), 2011, pp. 285–290.
Cook, Alejandro, et al. “Diagnostic Test of Robust Circuits.” 20th IEEE Asian Test Symposium (ATS’11), IEEE, 2011, pp. 285–90, doi:10.1109/ats.2011.55.

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