Signature Rollback - A Technique for Testing Robust Circuits
U. Amgalan, C. Hachmann, S. Hellebrand, H.-J. Wunderlich, in: 26th IEEE VLSI Test Symposium (VTS’08), IEEE, San Diego, CA, USA, 2008, pp. 125–130.
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Author
Amgalan, Uranmandakh;
Hachmann, Christian;
Hellebrand, SybilleLibreCat 
;
Wunderlich, Hans-Joachim
;
Wunderlich, Hans-JoachimDepartment
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Proceedings Title
26th IEEE VLSI Test Symposium (VTS'08)
Page
125-130
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Amgalan U, Hachmann C, Hellebrand S, Wunderlich H-J. Signature Rollback - A Technique for Testing Robust Circuits. In: 26th IEEE VLSI Test Symposium (VTS’08). IEEE; 2008:125-130. doi:10.1109/vts.2008.34
Amgalan, U., Hachmann, C., Hellebrand, S., & Wunderlich, H.-J. (2008). Signature Rollback - A Technique for Testing Robust Circuits. 26th IEEE VLSI Test Symposium (VTS’08), 125–130. https://doi.org/10.1109/vts.2008.34
@inproceedings{Amgalan_Hachmann_Hellebrand_Wunderlich_2008, place={San Diego, CA, USA}, title={Signature Rollback - A Technique for Testing Robust Circuits}, DOI={10.1109/vts.2008.34}, booktitle={26th IEEE VLSI Test Symposium (VTS’08)}, publisher={IEEE}, author={Amgalan, Uranmandakh and Hachmann, Christian and Hellebrand, Sybille and Wunderlich, Hans-Joachim}, year={2008}, pages={125–130} }
Amgalan, Uranmandakh, Christian Hachmann, Sybille Hellebrand, and Hans-Joachim Wunderlich. “Signature Rollback - A Technique for Testing Robust Circuits.” In 26th IEEE VLSI Test Symposium (VTS’08), 125–30. San Diego, CA, USA: IEEE, 2008. https://doi.org/10.1109/vts.2008.34.
U. Amgalan, C. Hachmann, S. Hellebrand, and H.-J. Wunderlich, “Signature Rollback - A Technique for Testing Robust Circuits,” in 26th IEEE VLSI Test Symposium (VTS’08), 2008, pp. 125–130, doi: 10.1109/vts.2008.34.
Amgalan, Uranmandakh, et al. “Signature Rollback - A Technique for Testing Robust Circuits.” 26th IEEE VLSI Test Symposium (VTS’08), IEEE, 2008, pp. 125–30, doi:10.1109/vts.2008.34.
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