Testing and Monitoring Nanoscale Systems - Challenges and Strategies for Advanced Quality Assurance
S. Hellebrand, C. G. Zoellin, H.-J. Wunderlich, S. Ludwig, T. Coym, B. Straube, in: 43rd International Conference on Microelectronics, Devices and Material with the Workshop on Electronic Testing (MIDEM’07), (Invited Paper), Bled, Slovenia, 2007.
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Hellebrand, SybilleLibreCat 
;
G. Zoellin, Christian;
Wunderlich, Hans-Joachim;
Ludwig, Stefan;
Coym, Torsten;
Straube, Bernd
;
G. Zoellin, Christian;
Wunderlich, Hans-Joachim;
Ludwig, Stefan;
Coym, Torsten;
Straube, BerndDepartment
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43rd International Conference on Microelectronics, Devices and Material with the Workshop on Electronic Testing (MIDEM'07), (Invited Paper)
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Hellebrand S, G. Zoellin C, Wunderlich H-J, Ludwig S, Coym T, Straube B. Testing and Monitoring Nanoscale Systems - Challenges and Strategies for Advanced Quality Assurance. In: 43rd International Conference on Microelectronics, Devices and Material with the Workshop on Electronic Testing (MIDEM’07), (Invited Paper). ; 2007.
Hellebrand, S., G. Zoellin, C., Wunderlich, H.-J., Ludwig, S., Coym, T., & Straube, B. (2007). Testing and Monitoring Nanoscale Systems - Challenges and Strategies for Advanced Quality Assurance. 43rd International Conference on Microelectronics, Devices and Material with the Workshop on Electronic Testing (MIDEM’07), (Invited Paper).
@inproceedings{Hellebrand_G. Zoellin_Wunderlich_Ludwig_Coym_Straube_2007, place={Bled, Slovenia}, title={Testing and Monitoring Nanoscale Systems - Challenges and Strategies for Advanced Quality Assurance}, booktitle={43rd International Conference on Microelectronics, Devices and Material with the Workshop on Electronic Testing (MIDEM’07), (Invited Paper)}, author={Hellebrand, Sybille and G. Zoellin, Christian and Wunderlich, Hans-Joachim and Ludwig, Stefan and Coym, Torsten and Straube, Bernd}, year={2007} }
Hellebrand, Sybille, Christian G. Zoellin, Hans-Joachim Wunderlich, Stefan Ludwig, Torsten Coym, and Bernd Straube. “Testing and Monitoring Nanoscale Systems - Challenges and Strategies for Advanced Quality Assurance.” In 43rd International Conference on Microelectronics, Devices and Material with the Workshop on Electronic Testing (MIDEM’07), (Invited Paper). Bled, Slovenia, 2007.
S. Hellebrand, C. G. Zoellin, H.-J. Wunderlich, S. Ludwig, T. Coym, and B. Straube, “Testing and Monitoring Nanoscale Systems - Challenges and Strategies for Advanced Quality Assurance,” 2007.
Hellebrand, Sybille, et al. “Testing and Monitoring Nanoscale Systems - Challenges and Strategies for Advanced Quality Assurance.” 43rd International Conference on Microelectronics, Devices and Material with the Workshop on Electronic Testing (MIDEM’07), (Invited Paper), 2007.
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