Design For Small Delay Test - A Simulation Study
M. Kampmann, S. Hellebrand, Microelectronics Reliability 80 (2018) 124–133.
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Journal Article
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Journal Title
Microelectronics Reliability
Volume
80
Page
124-133
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Kampmann M, Hellebrand S. Design For Small Delay Test - A Simulation Study. Microelectronics Reliability. 2018;80:124-133.
Kampmann, M., & Hellebrand, S. (2018). Design For Small Delay Test - A Simulation Study. Microelectronics Reliability, 80, 124–133.
@article{Kampmann_Hellebrand_2018, title={Design For Small Delay Test - A Simulation Study}, volume={80}, journal={Microelectronics Reliability}, author={Kampmann, Matthias and Hellebrand, Sybille}, year={2018}, pages={124–133} }
Kampmann, Matthias, and Sybille Hellebrand. “Design For Small Delay Test - A Simulation Study.” Microelectronics Reliability 80 (2018): 124–33.
M. Kampmann and S. Hellebrand, “Design For Small Delay Test - A Simulation Study,” Microelectronics Reliability, vol. 80, pp. 124–133, 2018.
Kampmann, Matthias, and Sybille Hellebrand. “Design For Small Delay Test - A Simulation Study.” Microelectronics Reliability, vol. 80, 2018, pp. 124–33.
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