New Transparent RAM BIST Based on Self-Adjusting Output Data Compression

V. N. Yarmolik, Y. V. Klimets, S. Hellebrand, H.-J. Wunderlich, in: {Design \& Diagnostics of Electronic Circuits \& Systems}, Szczyrk, Poland, 1998, pp. 27–33.

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{Design \& Diagnostics of Electronic Circuits \& Systems}
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27-33
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N. Yarmolik V, V. Klimets Y, Hellebrand S, Wunderlich H-J. New Transparent RAM BIST Based on Self-Adjusting Output Data Compression. In: {Design \& Diagnostics of Electronic Circuits \& Systems}. Szczyrk, Poland; 1998:27-33.
N. Yarmolik, V., V. Klimets, Y., Hellebrand, S., & Wunderlich, H.-J. (1998). New Transparent RAM BIST Based on Self-Adjusting Output Data Compression. In {Design \& Diagnostics of Electronic Circuits \& Systems} (pp. 27–33). Szczyrk, Poland.
@inproceedings{N. Yarmolik_V. Klimets_Hellebrand_Wunderlich_1998, place={Szczyrk, Poland}, title={New Transparent RAM BIST Based on Self-Adjusting Output Data Compression}, booktitle={{Design \& Diagnostics of Electronic Circuits \& Systems}}, author={N. Yarmolik, Vyacheslav and V. Klimets, Yuri and Hellebrand, Sybille and Wunderlich, Hans-Joachim}, year={1998}, pages={27–33} }
N. Yarmolik, Vyacheslav, Yuri V. Klimets, Sybille Hellebrand, and Hans-Joachim Wunderlich. “New Transparent RAM BIST Based on Self-Adjusting Output Data Compression.” In {Design \& Diagnostics of Electronic Circuits \& Systems}, 27–33. Szczyrk, Poland, 1998.
V. N. Yarmolik, Y. V. Klimets, S. Hellebrand, and H.-J. Wunderlich, “New Transparent RAM BIST Based on Self-Adjusting Output Data Compression,” in {Design \& Diagnostics of Electronic Circuits \& Systems}, 1998, pp. 27–33.
N. Yarmolik, Vyacheslav, et al. “New Transparent RAM BIST Based on Self-Adjusting Output Data Compression.” {Design \& Diagnostics of Electronic Circuits \& Systems}, 1998, pp. 27–33.

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