Dynamic Multi-Frequency Test Method for Hidden Interconnect Defects

S. Sadeghi-Kohan, S. Hellebrand, in: Proceedings IEEE VLSI Test Symposium, IEEE, n.d., pp. 1–6.

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Proceedings IEEE VLSI Test Symposium
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Sadeghi-Kohan S, Hellebrand S. Dynamic Multi-Frequency Test Method for Hidden Interconnect Defects . In: Proceedings IEEE VLSI Test Symposium. IEEE; :1-6.
Sadeghi-Kohan, S., & Hellebrand, S. (n.d.). Dynamic Multi-Frequency Test Method for Hidden Interconnect Defects . In Proceedings IEEE VLSI Test Symposium (pp. 1–6). IEEE.
@inproceedings{Sadeghi-Kohan_Hellebrand, title={Dynamic Multi-Frequency Test Method for Hidden Interconnect Defects }, booktitle={Proceedings IEEE VLSI Test Symposium}, publisher={IEEE}, author={Sadeghi-Kohan, Somayeh and Hellebrand, Sybille}, pages={1–6} }
Sadeghi-Kohan, Somayeh, and Sybille Hellebrand. “Dynamic Multi-Frequency Test Method for Hidden Interconnect Defects .” In Proceedings IEEE VLSI Test Symposium, 1–6. IEEE, n.d.
S. Sadeghi-Kohan and S. Hellebrand, “Dynamic Multi-Frequency Test Method for Hidden Interconnect Defects ,” in Proceedings IEEE VLSI Test Symposium, pp. 1–6.
Sadeghi-Kohan, Somayeh, and Sybille Hellebrand. “Dynamic Multi-Frequency Test Method for Hidden Interconnect Defects .” Proceedings IEEE VLSI Test Symposium, IEEE, pp. 1–6.

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