1 Publication

[1]
2020 | Conference Paper | LibreCat-ID: 19422
Variation-Aware Test for Logic Interconnects using Neural Networks - A Case Study
A. Sprenger, S. Sadeghi-Kohan, J.D. Reimer, S. Hellebrand, in: IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT’20), October 2020, Virtual Conference - Originally Frascati (Rome), Italy, n.d.
LibreCat
 

Search

Filter Publications

Display / Sort

Export / Embed

1 Publication

[1]
2020 | Conference Paper | LibreCat-ID: 19422
Variation-Aware Test for Logic Interconnects using Neural Networks - A Case Study
A. Sprenger, S. Sadeghi-Kohan, J.D. Reimer, S. Hellebrand, in: IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT’20), October 2020, Virtual Conference - Originally Frascati (Rome), Italy, n.d.
LibreCat
 

Search

Filter Publications

Display / Sort

Export / Embed