Interface Engineering of Molecular Charge Storage Dielectric Layers for Organic Thin-Film Memory Transistors
A. Khassanov, T. Schmaltz, H.-G. Steinrück, A. Magerl, A. Hirsch, M. Halik, Advanced Materials Interfaces 1 (2014) 1400238.
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Journal Article
| Published
| English
Author
Khassanov, Artoem;
Schmaltz, Thomas;
Steinrück, Hans-GeorgLibreCat 
;
Magerl, Andreas;
Hirsch, Andreas;
Halik, Marcus
;
Magerl, Andreas;
Hirsch, Andreas;
Halik, MarcusDepartment
Publishing Year
Journal Title
Advanced Materials Interfaces
Volume
1
Page
1400238
ISSN
LibreCat-ID
Cite this
Khassanov A, Schmaltz T, Steinrück H-G, Magerl A, Hirsch A, Halik M. Interface Engineering of Molecular Charge Storage Dielectric Layers for Organic Thin-Film Memory Transistors. Advanced Materials Interfaces. 2014;1:1400238. doi:10.1002/admi.201400238
Khassanov, A., Schmaltz, T., Steinrück, H.-G., Magerl, A., Hirsch, A., & Halik, M. (2014). Interface Engineering of Molecular Charge Storage Dielectric Layers for Organic Thin-Film Memory Transistors. Advanced Materials Interfaces, 1, 1400238. https://doi.org/10.1002/admi.201400238
@article{Khassanov_Schmaltz_Steinrück_Magerl_Hirsch_Halik_2014, title={Interface Engineering of Molecular Charge Storage Dielectric Layers for Organic Thin-Film Memory Transistors}, volume={1}, DOI={10.1002/admi.201400238}, journal={Advanced Materials Interfaces}, author={Khassanov, Artoem and Schmaltz, Thomas and Steinrück, Hans-Georg and Magerl, Andreas and Hirsch, Andreas and Halik, Marcus}, year={2014}, pages={1400238} }
Khassanov, Artoem, Thomas Schmaltz, Hans-Georg Steinrück, Andreas Magerl, Andreas Hirsch, and Marcus Halik. “Interface Engineering of Molecular Charge Storage Dielectric Layers for Organic Thin-Film Memory Transistors.” Advanced Materials Interfaces 1 (2014): 1400238. https://doi.org/10.1002/admi.201400238.
A. Khassanov, T. Schmaltz, H.-G. Steinrück, A. Magerl, A. Hirsch, and M. Halik, “Interface Engineering of Molecular Charge Storage Dielectric Layers for Organic Thin-Film Memory Transistors,” Advanced Materials Interfaces, vol. 1, p. 1400238, 2014, doi: 10.1002/admi.201400238.
Khassanov, Artoem, et al. “Interface Engineering of Molecular Charge Storage Dielectric Layers for Organic Thin-Film Memory Transistors.” Advanced Materials Interfaces, vol. 1, 2014, p. 1400238, doi:10.1002/admi.201400238.
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