Fault Injection and Mixed-Level Simulation for Analog Circuits - A Case Study

S. Abughannam, L. Wu, W. Müller, C. Scheytt, in: Analog 2016 - VDE, 2016.

Download
No fulltext has been uploaded.
Conference Paper | English
Abstract
The design of safety critical systems requires an efficient methodology for an effective fault effect simulation for analog and digital circuits where analog fault injection and fault effect simulation is currently a field of active research and commercial tools are not available yet. This article begins by discussing fault injection strategies for analog circuits applied on a case study with two topologies of a Voltage Controlled Oscillator (VCO). In the second part it performs on the basis of the example of a Wireless Sensor Network (WSN) node, how far different mixed level implementations with Verilog-A and SPICE can affect the simulation time and points out which component consumes the major part of the simulation time.
Publishing Year
Proceedings Title
Analog 2016 - VDE
LibreCat-ID

Cite this

Abughannam S, Wu L, Müller W, Scheytt C. Fault Injection and Mixed-Level Simulation for Analog Circuits - A Case Study. In: Analog 2016 - VDE. ; 2016.
Abughannam, S., Wu, L., Müller, W., & Scheytt, C. (2016). Fault Injection and Mixed-Level Simulation for Analog Circuits - A Case Study. Analog 2016 - VDE.
@inproceedings{Abughannam_Wu_Müller_Scheytt_2016, title={Fault Injection and Mixed-Level Simulation for Analog Circuits - A Case Study}, booktitle={Analog 2016 - VDE}, author={Abughannam, Saed and Wu, Liang and Müller, Wolfgang and Scheytt, Christoph}, year={2016} }
Abughannam, Saed, Liang Wu, Wolfgang Müller, and Christoph Scheytt. “Fault Injection and Mixed-Level Simulation for Analog Circuits - A Case Study.” In Analog 2016 - VDE, 2016.
S. Abughannam, L. Wu, W. Müller, and C. Scheytt, “Fault Injection and Mixed-Level Simulation for Analog Circuits - A Case Study,” 2016.
Abughannam, Saed, et al. “Fault Injection and Mixed-Level Simulation for Analog Circuits - A Case Study.” Analog 2016 - VDE, 2016.

Export

Marked Publications

Open Data LibreCat

Search this title in

Google Scholar