10 Publications
2021 | Journal Article | LibreCat-ID: 29210
Analysis and Design of a Charge Sampler With 70-GHz 1-dB Bandwidth in 130-nm SiGe BiCMOS
L. Wu, J.C. Scheytt, IEEE Transactions on Circuits and Systems I: Regular Papers 68 (2021) 3668–3681.
LibreCat
| Files available
| DOI
L. Wu, J.C. Scheytt, IEEE Transactions on Circuits and Systems I: Regular Papers 68 (2021) 3668–3681.
2021 | Dissertation | LibreCat-ID: 52664
Ultrabreitbandige Sampler in SiGe-BiCMOS-Technologie für Analog-Digital-Wandler mit zeitversetzter Abtastung
L. Wu, Ultrabreitbandige Sampler in SiGe-BiCMOS-Technologie Für Analog-Digital-Wandler Mit Zeitversetzter Abtastung, 2021.
LibreCat
L. Wu, Ultrabreitbandige Sampler in SiGe-BiCMOS-Technologie Für Analog-Digital-Wandler Mit Zeitversetzter Abtastung, 2021.
2020 | Conference Paper | LibreCat-ID: 24021
Above 60 GHz Bandwidth 10 GS/s Sampling Rate Track-and-Hold Amplifier in 130 nm SiGe BiCMOS Technology
L. Wu, M. Weizel, C. Scheytt, in: 2020 IEEE International Symposium on Circuits and Systems (ISCAS), IEEE, Sevilla, Spain, 2020.
LibreCat
| Files available
| DOI
L. Wu, M. Weizel, C. Scheytt, in: 2020 IEEE International Symposium on Circuits and Systems (ISCAS), IEEE, Sevilla, Spain, 2020.
2019 | Conference Paper | LibreCat-ID: 24049
70 GHz Large-signal Bandwidth Sampler Using Current-mode Integrate-and-Hold Circuit in 130 nm SiGe BiCMOS Technology
L. Wu, M. Weizel, C. Scheytt, in: Asia-Pacific Microwave Conference (APMC), 2019.
LibreCat
| Files available
| DOI
L. Wu, M. Weizel, C. Scheytt, in: Asia-Pacific Microwave Conference (APMC), 2019.
2019 | Conference Paper | LibreCat-ID: 24052
A 70 GHz Small-signal Bandwidth 40 GS/s Track-and-Hold Amplifier in 130 nm SiGe BiCMOS Technology
L. Wu, M. Weizel, C. Scheytt, in: 26th IEEE International Conference on Electronics Circuits and Systems (ICECS), Genova, Italy, 2019.
LibreCat
| Files available
| DOI
L. Wu, M. Weizel, C. Scheytt, in: 26th IEEE International Conference on Electronics Circuits and Systems (ICECS), Genova, Italy, 2019.
2018 | Conference Paper | LibreCat-ID: 24196
Analog fault simulation automation at schematic level with random sampling techniques
L. Wu, M.K. Hussain, S. Abughannam, W. Müller, C. Scheytt, W. Ecker, in: 2018 13th International Conference on Design & Technology of Integrated Systems In Nanoscale Era (DTIS)) , IEEE, Italy/Taormina, 2018.
LibreCat
| Files available
| DOI
L. Wu, M.K. Hussain, S. Abughannam, W. Müller, C. Scheytt, W. Ecker, in: 2018 13th International Conference on Design & Technology of Integrated Systems In Nanoscale Era (DTIS)) , IEEE, Italy/Taormina, 2018.
2018 | Patent | LibreCat-ID: 24198
Integrier‐ und Halte‐Schaltung
C. Scheytt, L. Wu, (2018).
LibreCat
| Files available
C. Scheytt, L. Wu, (2018).
2017 | Conference Paper | LibreCat-ID: 24223
SPICE-Level Fault Injection with Likelihood Weighted Random Sampling - A Case Study
L. Wu, S. Abughannam, W. Müller, C. Scheytt, W. Ecker, in: 2nd Workshop on Resiliency in Embedded Electronic Systems (REES), Lausanne, Switzerland, 2017, p. 68.
LibreCat
| Files available
L. Wu, S. Abughannam, W. Müller, C. Scheytt, W. Ecker, in: 2nd Workshop on Resiliency in Embedded Electronic Systems (REES), Lausanne, Switzerland, 2017, p. 68.
2016 | Conference Paper | LibreCat-ID: 24263
Fault Injection and Mixed-Level Simulation for Analog Circuits - A Case Study
S. Abughannam, L. Wu, W. Müller, C. Scheytt, W. Ecker, C. Novello, in: Analog 2016 - VDE, 2016.
LibreCat
| Files available
S. Abughannam, L. Wu, W. Müller, C. Scheytt, W. Ecker, C. Novello, in: Analog 2016 - VDE, 2016.
2015 | Conference Paper | LibreCat-ID: 24289
On the Correlation of HW Faults and SW Errors
W. Müller, L. Wu, C. Scheytt, M. Becker, S. Schoenberg, in: D. Mueller-Gritschneder, W. Müller, S. Mitra (Eds.), Proceedings of the 1st International Workshop on Resiliency in Embedded Electronic Systems (REES 2014), Amsterdam, Netherland, 2015.
LibreCat
W. Müller, L. Wu, C. Scheytt, M. Becker, S. Schoenberg, in: D. Mueller-Gritschneder, W. Müller, S. Mitra (Eds.), Proceedings of the 1st International Workshop on Resiliency in Embedded Electronic Systems (REES 2014), Amsterdam, Netherland, 2015.
10 Publications
2021 | Journal Article | LibreCat-ID: 29210
Analysis and Design of a Charge Sampler With 70-GHz 1-dB Bandwidth in 130-nm SiGe BiCMOS
L. Wu, J.C. Scheytt, IEEE Transactions on Circuits and Systems I: Regular Papers 68 (2021) 3668–3681.
LibreCat
| Files available
| DOI
L. Wu, J.C. Scheytt, IEEE Transactions on Circuits and Systems I: Regular Papers 68 (2021) 3668–3681.
2021 | Dissertation | LibreCat-ID: 52664
Ultrabreitbandige Sampler in SiGe-BiCMOS-Technologie für Analog-Digital-Wandler mit zeitversetzter Abtastung
L. Wu, Ultrabreitbandige Sampler in SiGe-BiCMOS-Technologie Für Analog-Digital-Wandler Mit Zeitversetzter Abtastung, 2021.
LibreCat
L. Wu, Ultrabreitbandige Sampler in SiGe-BiCMOS-Technologie Für Analog-Digital-Wandler Mit Zeitversetzter Abtastung, 2021.
2020 | Conference Paper | LibreCat-ID: 24021
Above 60 GHz Bandwidth 10 GS/s Sampling Rate Track-and-Hold Amplifier in 130 nm SiGe BiCMOS Technology
L. Wu, M. Weizel, C. Scheytt, in: 2020 IEEE International Symposium on Circuits and Systems (ISCAS), IEEE, Sevilla, Spain, 2020.
LibreCat
| Files available
| DOI
L. Wu, M. Weizel, C. Scheytt, in: 2020 IEEE International Symposium on Circuits and Systems (ISCAS), IEEE, Sevilla, Spain, 2020.
2019 | Conference Paper | LibreCat-ID: 24049
70 GHz Large-signal Bandwidth Sampler Using Current-mode Integrate-and-Hold Circuit in 130 nm SiGe BiCMOS Technology
L. Wu, M. Weizel, C. Scheytt, in: Asia-Pacific Microwave Conference (APMC), 2019.
LibreCat
| Files available
| DOI
L. Wu, M. Weizel, C. Scheytt, in: Asia-Pacific Microwave Conference (APMC), 2019.
2019 | Conference Paper | LibreCat-ID: 24052
A 70 GHz Small-signal Bandwidth 40 GS/s Track-and-Hold Amplifier in 130 nm SiGe BiCMOS Technology
L. Wu, M. Weizel, C. Scheytt, in: 26th IEEE International Conference on Electronics Circuits and Systems (ICECS), Genova, Italy, 2019.
LibreCat
| Files available
| DOI
L. Wu, M. Weizel, C. Scheytt, in: 26th IEEE International Conference on Electronics Circuits and Systems (ICECS), Genova, Italy, 2019.
2018 | Conference Paper | LibreCat-ID: 24196
Analog fault simulation automation at schematic level with random sampling techniques
L. Wu, M.K. Hussain, S. Abughannam, W. Müller, C. Scheytt, W. Ecker, in: 2018 13th International Conference on Design & Technology of Integrated Systems In Nanoscale Era (DTIS)) , IEEE, Italy/Taormina, 2018.
LibreCat
| Files available
| DOI
L. Wu, M.K. Hussain, S. Abughannam, W. Müller, C. Scheytt, W. Ecker, in: 2018 13th International Conference on Design & Technology of Integrated Systems In Nanoscale Era (DTIS)) , IEEE, Italy/Taormina, 2018.
2018 | Patent | LibreCat-ID: 24198
Integrier‐ und Halte‐Schaltung
C. Scheytt, L. Wu, (2018).
LibreCat
| Files available
C. Scheytt, L. Wu, (2018).
2017 | Conference Paper | LibreCat-ID: 24223
SPICE-Level Fault Injection with Likelihood Weighted Random Sampling - A Case Study
L. Wu, S. Abughannam, W. Müller, C. Scheytt, W. Ecker, in: 2nd Workshop on Resiliency in Embedded Electronic Systems (REES), Lausanne, Switzerland, 2017, p. 68.
LibreCat
| Files available
L. Wu, S. Abughannam, W. Müller, C. Scheytt, W. Ecker, in: 2nd Workshop on Resiliency in Embedded Electronic Systems (REES), Lausanne, Switzerland, 2017, p. 68.
2016 | Conference Paper | LibreCat-ID: 24263
Fault Injection and Mixed-Level Simulation for Analog Circuits - A Case Study
S. Abughannam, L. Wu, W. Müller, C. Scheytt, W. Ecker, C. Novello, in: Analog 2016 - VDE, 2016.
LibreCat
| Files available
S. Abughannam, L. Wu, W. Müller, C. Scheytt, W. Ecker, C. Novello, in: Analog 2016 - VDE, 2016.
2015 | Conference Paper | LibreCat-ID: 24289
On the Correlation of HW Faults and SW Errors
W. Müller, L. Wu, C. Scheytt, M. Becker, S. Schoenberg, in: D. Mueller-Gritschneder, W. Müller, S. Mitra (Eds.), Proceedings of the 1st International Workshop on Resiliency in Embedded Electronic Systems (REES 2014), Amsterdam, Netherland, 2015.
LibreCat
W. Müller, L. Wu, C. Scheytt, M. Becker, S. Schoenberg, in: D. Mueller-Gritschneder, W. Müller, S. Mitra (Eds.), Proceedings of the 1st International Workshop on Resiliency in Embedded Electronic Systems (REES 2014), Amsterdam, Netherland, 2015.