An applied noise model for low-loss EELS maps
J.K.N. Lindner, C. Zietlow, Ultramicroscopy (2025).
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Journal Article
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| English
Author
Lindner, Jörg K. N.LibreCat;
Zietlow, Christian
Publishing Year
Journal Title
Ultramicroscopy
Article Number
114101
ISSN
LibreCat-ID
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Lindner JKN, Zietlow C. An applied noise model for low-loss EELS maps. Ultramicroscopy. Published online 2025. doi:10.1016/j.ultramic.2024.114101
Lindner, J. K. N., & Zietlow, C. (2025). An applied noise model for low-loss EELS maps. Ultramicroscopy, Article 114101. https://doi.org/10.1016/j.ultramic.2024.114101
@article{Lindner_Zietlow_2025, title={An applied noise model for low-loss EELS maps}, DOI={10.1016/j.ultramic.2024.114101}, number={114101}, journal={Ultramicroscopy}, publisher={Elsevier BV}, author={Lindner, Jörg K. N. and Zietlow, Christian}, year={2025} }
Lindner, Jörg K. N., and Christian Zietlow. “An Applied Noise Model for Low-Loss EELS Maps.” Ultramicroscopy, 2025. https://doi.org/10.1016/j.ultramic.2024.114101.
J. K. N. Lindner and C. Zietlow, “An applied noise model for low-loss EELS maps,” Ultramicroscopy, Art. no. 114101, 2025, doi: 10.1016/j.ultramic.2024.114101.
Lindner, Jörg K. N., and Christian Zietlow. “An Applied Noise Model for Low-Loss EELS Maps.” Ultramicroscopy, 114101, Elsevier BV, 2025, doi:10.1016/j.ultramic.2024.114101.
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