TiO2–x-Enhanced IR Hot Carrier Based Photodetection in Metal Thin Film–Si Junctions
N.A. Güsken, A. Lauri, Y. Li, T. Matsui, B. Doiron, R. Bower, A. Regoutz, A. Mihai, P.K. Petrov, R.F. Oulton, L.F. Cohen, S.A. Maier, ACS Photonics 6 (2019) 953–960.
Download
No fulltext has been uploaded.
Journal Article
| Published
| English
Author
Güsken, Nicholas A.;
Lauri, Alberto;
Li, Yi;
Matsui, Takayuki;
Doiron, Brock;
Bower, Ryan;
Regoutz, Anna;
Mihai, Andrei;
Petrov, Peter K.;
Oulton, Rupert F.;
Cohen, Lesley F.;
Maier, Stefan A.
All
All
Publishing Year
Journal Title
ACS Photonics
Volume
6
Issue
4
Page
953-960
LibreCat-ID
Cite this
Güsken NA, Lauri A, Li Y, et al. TiO2–x-Enhanced IR Hot Carrier Based Photodetection in Metal Thin Film–Si Junctions. ACS Photonics. 2019;6(4):953-960. doi:10.1021/acsphotonics.8b01639
Güsken, N. A., Lauri, A., Li, Y., Matsui, T., Doiron, B., Bower, R., Regoutz, A., Mihai, A., Petrov, P. K., Oulton, R. F., Cohen, L. F., & Maier, S. A. (2019). TiO2–x-Enhanced IR Hot Carrier Based Photodetection in Metal Thin Film–Si Junctions. ACS Photonics, 6(4), 953–960. https://doi.org/10.1021/acsphotonics.8b01639
@article{Güsken_Lauri_Li_Matsui_Doiron_Bower_Regoutz_Mihai_Petrov_Oulton_et al._2019, title={TiO2–x-Enhanced IR Hot Carrier Based Photodetection in Metal Thin Film–Si Junctions}, volume={6}, DOI={10.1021/acsphotonics.8b01639}, number={4}, journal={ACS Photonics}, publisher={American Chemical Society (ACS)}, author={Güsken, Nicholas A. and Lauri, Alberto and Li, Yi and Matsui, Takayuki and Doiron, Brock and Bower, Ryan and Regoutz, Anna and Mihai, Andrei and Petrov, Peter K. and Oulton, Rupert F. and et al.}, year={2019}, pages={953–960} }
Güsken, Nicholas A., Alberto Lauri, Yi Li, Takayuki Matsui, Brock Doiron, Ryan Bower, Anna Regoutz, et al. “TiO2–x-Enhanced IR Hot Carrier Based Photodetection in Metal Thin Film–Si Junctions.” ACS Photonics 6, no. 4 (2019): 953–60. https://doi.org/10.1021/acsphotonics.8b01639.
N. A. Güsken et al., “TiO2–x-Enhanced IR Hot Carrier Based Photodetection in Metal Thin Film–Si Junctions,” ACS Photonics, vol. 6, no. 4, pp. 953–960, 2019, doi: 10.1021/acsphotonics.8b01639.
Güsken, Nicholas A., et al. “TiO2–x-Enhanced IR Hot Carrier Based Photodetection in Metal Thin Film–Si Junctions.” ACS Photonics, vol. 6, no. 4, American Chemical Society (ACS), 2019, pp. 953–60, doi:10.1021/acsphotonics.8b01639.
Google Scholar