OCTO+: Optimized Checkpointing of B+ Trees for Non-Volatile Main Memory Wear-Leveling
C. Hakert, R. Kuhn, K.-H. Chen, J.-J. Chen, J. Teubner, in: 2021 IEEE 10th Non-Volatile Memory Systems and Applications Symposium (NVMSA), IEEE, 2021.
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Hakert, Christian;
Kuhn, Roland;
Chen, Kuan-Hsun;
Chen, Jian-Jia;
Teubner, Jens
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2021 IEEE 10th Non-Volatile Memory Systems and Applications Symposium (NVMSA)
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Hakert C, Kuhn R, Chen K-H, Chen J-J, Teubner J. OCTO+: Optimized Checkpointing of B+ Trees for Non-Volatile Main Memory Wear-Leveling. In: 2021 IEEE 10th Non-Volatile Memory Systems and Applications Symposium (NVMSA). IEEE; 2021. doi:10.1109/nvmsa53655.2021.9628460
Hakert, C., Kuhn, R., Chen, K.-H., Chen, J.-J., & Teubner, J. (2021). OCTO+: Optimized Checkpointing of B+ Trees for Non-Volatile Main Memory Wear-Leveling. 2021 IEEE 10th Non-Volatile Memory Systems and Applications Symposium (NVMSA). https://doi.org/10.1109/nvmsa53655.2021.9628460
@inproceedings{Hakert_Kuhn_Chen_Chen_Teubner_2021, title={OCTO+: Optimized Checkpointing of B+ Trees for Non-Volatile Main Memory Wear-Leveling}, DOI={10.1109/nvmsa53655.2021.9628460}, booktitle={2021 IEEE 10th Non-Volatile Memory Systems and Applications Symposium (NVMSA)}, publisher={IEEE}, author={Hakert, Christian and Kuhn, Roland and Chen, Kuan-Hsun and Chen, Jian-Jia and Teubner, Jens}, year={2021} }
Hakert, Christian, Roland Kuhn, Kuan-Hsun Chen, Jian-Jia Chen, and Jens Teubner. “OCTO+: Optimized Checkpointing of B+ Trees for Non-Volatile Main Memory Wear-Leveling.” In 2021 IEEE 10th Non-Volatile Memory Systems and Applications Symposium (NVMSA). IEEE, 2021. https://doi.org/10.1109/nvmsa53655.2021.9628460.
C. Hakert, R. Kuhn, K.-H. Chen, J.-J. Chen, and J. Teubner, “OCTO+: Optimized Checkpointing of B+ Trees for Non-Volatile Main Memory Wear-Leveling,” 2021, doi: 10.1109/nvmsa53655.2021.9628460.
Hakert, Christian, et al. “OCTO+: Optimized Checkpointing of B+ Trees for Non-Volatile Main Memory Wear-Leveling.” 2021 IEEE 10th Non-Volatile Memory Systems and Applications Symposium (NVMSA), IEEE, 2021, doi:10.1109/nvmsa53655.2021.9628460.
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