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39 Publications
2002 | Misc | LibreCat-ID: 13097
S. Hellebrand and A. Wuertenberger, Alternating Run-Length Coding: A Technique for Improved Test Data Compression. IEEE International Workshop on Test Resource Partitioning, Baltimore, MD, USA, 2002.
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2001 | Misc | LibreCat-ID: 13096
H.-G. Liang, S. Hellebrand, and H.-J. Wunderlich, Two-Dimensional Test Data Compression for Scan-Based Deterministic BIST. IEEE European Test Workshop, Stockholm, Sweden, 2001.
LibreCat
2000 | Misc | LibreCat-ID: 13095
S. Hellebrand, H.-G. Liang, and H.-J. Wunderlich, A Mixed Mode BIST Scheme Based on Reseeding of Folding Counters. IEEE European Test Workshop, Cascais, Portugal, 2000.
LibreCat
1999 | Misc | LibreCat-ID: 13093
S. Hellebrand, H.-J. Wunderlich, and V. N. Yarmolik, Exploiting Symmetries to Speed Up Transparent BIST. 11th GI/ITG/GMM/IEEE Workshop, 1999.
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1998 | Misc | LibreCat-ID: 13091
V. N. Yarmolik, S. Hellebrand, and H.-J. Wunderlich, Efficient Consistency Checking for Embedded Memories. 5th IEEE International Test Synthesis Workshop, Santa Barbara, CA, USA, 1998.
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1998 | Misc | LibreCat-ID: 13092
V. N. Yarmolik, S. Hellebrand, and H.-J. Wunderlich, Efficient Consistency Checking for Embedded Memories. 10th GI/ITG/GMM/IEEE Workshop, 1998.
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1997 | Misc | LibreCat-ID: 13089
K.-H. Tsai, S. Hellebrand, J. Rajski, and M. Marek-Sadowska, STARBIST: Scan Autocorrelated Random Pattern Generation. 4th IEEE International Test Synthesis Workshop, Santa Barbara, CA, USA, 1997.
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1997 | Misc | LibreCat-ID: 13090
A. Hertwig, S. Hellebrand, and H.-J. Wunderlich, Synthesis of Fast On-Line Testable Controllers for Data-Dominated Applications. 3rd IEEE International On-Line Testing Workshop, Crete, Greece, 1997.
LibreCat
1996 | Misc | LibreCat-ID: 13087
S. Hellebrand and H.-J. Wunderlich, Using Embedded Processors for BIST. 3rd IEEE International Test Synthesis Workshop, Santa Barbara, CA, 1996.
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1996 | Misc | LibreCat-ID: 13088
S. Hellebrand, H.-J. Wunderlich, and A. Hertwig, Mixed-Mode BIST Using Embedded Processors. 2nd IEEE International On-Line Testing Workshop. Biarritz, France, 1996.
LibreCat
1995 | Misc | LibreCat-ID: 13086
S. Hellebrand, B. Reeb, S. Tarnick, and H.-J. Wunderlich, Pattern Generation for a Deterministic BIST Scheme. 2nd IEEE International Test Synthesis Workshop, Santa Barbara, CA, 1995.
LibreCat
1994 | Misc | LibreCat-ID: 13083
S. Venkataraman, J. Rajski, S. Hellebrand, and S. Tarnick, Effiziente Testsatzkodierung für Prüfpfad-basierte Selbsttestarchitekturen. 6th ITG/GI/GME Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen”, Vaals, The Netherlands, 1994.
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1994 | Misc | LibreCat-ID: 13084
S. Hellebrand and H.-J. Wunderlich, Ein Verfahren zur testfreundlichen Steuerwerkssynthese. 6th ITG/GI/GME Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen”, Vaals, The Netherlands, 1994.
LibreCat
1994 | Misc | LibreCat-ID: 13085
S. Hellebrand, J. Paulo Teixeira, and H.-J. Wunderlich, Synthesis for Testability - the ARCHIMEDES Approach. 1st IEEE International Test Synthesis Workshop, Santa Barbara, CA, USA, 1994.
LibreCat
1993 | Misc | LibreCat-ID: 13081
S. Hellebrand, S. Tarnick, J. Rajski, and B. Courtois, Effiziente Erzeugung deterministischer Muster im Selbsttest. 5th ITG/GI/GME Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen”, Holzhau, Germany, 1993.
LibreCat
1993 | Misc | LibreCat-ID: 13082
S. Hellebrand and H.-J. Wunderlich, Synthesis of Self-Testable Controllers. ARCHIMEDES Open Workshop on “Synthesis - Architectural Testability Support”, Montpellier, France, 1993.
LibreCat
1992 | Misc | LibreCat-ID: 13076
S. Hellebrand, S. Tarnick, J. Rajski, and B. Courtois, Generation of Vector Patterns through Reseeding of Multiple-Polynomial LFSRs. IEEE Design for Testability Workshop, Vail, CO, USA, 1992.
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1992 | Misc | LibreCat-ID: 13080
S. Hellebrand, S. Tarnick, J. Rajski, and B. Courtois, Generation of Vector Patterns through Reseeding of Multiple-Polynomial LFSRs. Workshop on New Directions for Testing, Montreal, Canada, 1992.
LibreCat
1990 | Misc | LibreCat-ID: 13103
S. Hellebrand, H.-J. Wunderlich, and O. F. Haberl, Generating Pseudo-Exhaustive Vectors for External Testing. IEEE Design for Testability Workshop, Vail, CO, USA, 1990.
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