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40 Publications
2006 | Conference Paper | LibreCat-ID: 39842
Pannemann, C., Diekmann, T., Hilleringmann, U., Schurmann, U., Scharnberg, M., Zaporojtchenko, V., Adelung, R., & Faupel, F. (2006). Encapsulating the active Layer of organic Thin-Film Transistors. Polytronic 2005 - 5th International Conference on Polymers and Adhesives in Microelectronics and Photonics. https://doi.org/10.1109/polytr.2005.1596488
LibreCat
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2005 | Journal Article | LibreCat-ID: 39846
Pannemann, Ch., Diekmann, T., & Hilleringmann, U. (2005). Degradation of organic field-effect transistors made of pentacene. Journal of Materials Research, 19(7), 1999–2002. https://doi.org/10.1557/jmr.2004.0267
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2005 | Conference Paper | LibreCat-ID: 39848
Pannemann, Ch., Diekmann, T., & Hilleringmann, U. (2005). On the degradation of organic field-effect transistors. Proceedings. The 16th International Conference on Microelectronics, 2004. ICM 2004. https://doi.org/10.1109/icm.2004.1434210
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2005 | Journal Article | LibreCat-ID: 39349
Pannemann, Ch., Diekmann, T., & Hilleringmann, U. (2005). Degradation of organic field-effect transistors made of pentacene. Journal of Materials Research, 19(7), 1999–2002. https://doi.org/10.1557/jmr.2004.0267
LibreCat
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2005 | Journal Article | LibreCat-ID: 39574
Scharnberg, M., Hu, J., Kanzow, J., Rätzke, K., Adelung, R., Faupel, F., Pannemann, C., Hilleringmann, U., Meyer, S., & Pflaum, J. (2005). Radiotracer measurements as a sensitive tool for the detection of metal penetration in molecular-based organic electronics. Applied Physics Letters, 86(2), Article 024104. https://doi.org/10.1063/1.1849845
LibreCat
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2005 | Conference Paper | LibreCat-ID: 39835
Scholz, R., Müller, A.-D., Müller, F., Thurzo, I., Paez, B. A., Mancera, L., Zahn, D. R. T., Pannemann, C., & Hilleringmann, U. (2005). Comparison between the charge carrier mobilities in pentacene OFET structures as obtained from electrical characterization and potentiometry. In Z. Bao & D. J. Gundlach (Eds.), SPIE Proceedings. SPIE. https://doi.org/10.1117/12.617004
LibreCat
| DOI
2005 | Conference Paper | LibreCat-ID: 39834
Scholz, R., Müller, A.-D., Müller, F., Thurzo, I., Paez, B. A., Mancera, L., Zahn, D. R. T., Pannemann, C., & Hilleringmann, U. (2005). Comparison between the charge carrier mobilities in pentacene OFET structures as obtained from electrical characterization and potentiometry. In Z. Bao & D. J. Gundlach (Eds.), SPIE Proceedings. SPIE. https://doi.org/10.1117/12.617004
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2004 | Book Chapter | LibreCat-ID: 39850
Hilleringmann, U. (2004). Ätztechnik. In Silizium-Halbleitertechnologie (pp. 65–90). Vieweg+Teubner Verlag. https://doi.org/10.1007/978-3-322-94072-8_5
LibreCat
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2004 | Conference Paper | LibreCat-ID: 39872
Hilleringmann, U., & Pannemann, C. (2004). Imprint structured organic thin film transistors as driving circuit in single-use sensor applications. In G. Zhang, H. Zhao, & Z. Wang (Eds.), Fifth International Symposium on Instrumentation and Control Technology. SPIE. https://doi.org/10.1117/12.521463
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2004 | Conference Paper | LibreCat-ID: 39873
Otterbach, R., & Hilleringmann, U. (2004). Piezoresistive pressure sensors in CVD diamond for high-temperature applications. In G. Zhang, H. Zhao, & Z. Wang (Eds.), Fifth International Symposium on Instrumentation and Control Technology. SPIE. https://doi.org/10.1117/12.521928
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2003 | Conference Paper | LibreCat-ID: 39887
Hilleringmann, U., Vieregge, T., & Horstmann, J. T. (2003). Masking and etching of silicon and related materials for geometries down to 25 nm. IECON’99. Conference Proceedings. 25th Annual Conference of the IEEE Industrial Electronics Society (Cat. No.99CH37029). https://doi.org/10.1109/iecon.1999.822171
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2003 | Conference Paper | LibreCat-ID: 39888
Horstmann, J. T., Hilleringmann, U., & Goser, K. (2003). Matching analysis of NMOS-transistors with a channel length down to 30 nm. IECON’99. Conference Proceedings. 25th Annual Conference of the IEEE Industrial Electronics Society (Cat. No.99CH37029). https://doi.org/10.1109/iecon.1999.822163
LibreCat
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2003 | Conference Paper | LibreCat-ID: 39885
Wirth, G., Hilleringmann, U., Horstmann, J. T., & Goser, K. (2003). Negative differential resistance in ultrashort bulk MOSFETs. IECON’99. Conference Proceedings. 25th Annual Conference of the IEEE Industrial Electronics Society (Cat. No.99CH37029). https://doi.org/10.1109/iecon.1999.822164
LibreCat
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2003 | Journal Article | LibreCat-ID: 39851
Pannemann, Ch., Diekmann, T., & Hilleringmann, U. (2003). Nanometer scale organic thin film transistors with Pentacene. Microelectronic Engineering, 67–68, 845–852. https://doi.org/10.1016/s0167-9317(03)00146-1
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2002 | Journal Article | LibreCat-ID: 39904
Hilleringmann, U., & Goser, K. (2002). Optoelectronic system integration on silicon: waveguides, photodetectors, and VLSI CMOS circuits on one chip. IEEE Transactions on Electron Devices, 42(5), 841–846. https://doi.org/10.1109/16.381978
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2002 | Journal Article | LibreCat-ID: 39912
Schönstein, I., Müller, J., Hilleringmann, U., & Goser, K. (2002). Characterization of submicron NMOS devices due to visible light emission. Microelectronic Engineering, 21(1–4), 363–366. https://doi.org/10.1016/0167-9317(93)90092-j
LibreCat
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2002 | Journal Article | LibreCat-ID: 39914
Hilleringmann, U., & Goser, K. (2002). Results of monolithic integration of optical waveguides, photodiodes and CMOS circuits on silicon. Microelectronic Engineering, 19(1–4), 211–214. https://doi.org/10.1016/0167-9317(92)90425-q
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2002 | Journal Article | LibreCat-ID: 39906
Brass, E., Hilleringmann, U., & Schumacher, K. (2002). System integration of optical devices and analog CMOS amplifiers. IEEE Journal of Solid-State Circuits, 29(8), 1006–1010. https://doi.org/10.1109/4.297714
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2002 | Journal Article | LibreCat-ID: 39907
Brass, E., Hilleringmann, U., & Schumacher, K. (2002). System integration of optical devices and analog CMOS amplifiers. IEEE Journal of Solid-State Circuits, 29(8), 1006–1010. https://doi.org/10.1109/4.297714
LibreCat
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2002 | Journal Article | LibreCat-ID: 39899
Horstmann, J. T., Hilleringmann, U., & Goser, K. (2002). Characterisation of sub-100 nm-MOS-transistors processed by optical lithography and a sidewall-etchback technique. Microelectronic Engineering, 30(1–4), 431–434. https://doi.org/10.1016/0167-9317(95)00280-4
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